Advances in Imaging and Electron Physics, Volume 161: Optics of Charged Particle Analyzers
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- 出版商: Academic Press
- 出版日期: 2010-03-25
- 售價: $8,410
- 貴賓價: 9.5 折 $7,990
- 語言: 英文
- 頁數: 304
- 裝訂: Hardcover
- ISBN: 0123813182
- ISBN-13: 9780123813183
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相關分類:
光學 Optics、物理學 Physics
海外代購書籍(需單獨結帳)
商品描述
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
