Particles and Waves in Electron Optics and Microscopy, Volume 194 (Advances in Imaging and Electron Physics)
- 出版商: Academic Press
- 出版日期: 2016-05-27
- 售價: $8,410
- 貴賓價: 9.5 折 $7,990
- 語言: 英文
- 頁數: 358
- 裝訂: Hardcover
- ISBN: 012804814X
- ISBN-13: 9780128048146
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相關分類:
光學 Optics、物理學 Physics
海外代購書籍(需單獨結帳)
相關主題
商品描述
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
商品描述(中文翻譯)
《影像與電子物理的進展》結合了兩本長期出版的期刊,《電子與電子物理的進展》和《光學與電子顯微鏡的進展》。該系列包含有關電子設備(特別是半導體設備)物理學、高低能粒子光學、微影技術、影像科學、數位影像處理、電磁波傳播、電子顯微鏡以及在這些領域中使用的計算方法的延伸文章。
- 包含來自該領域領先權威的貢獻
- 通報並更新影像與電子物理領域的最新發展
- 為對顯微鏡學、光學、影像處理、數學形態學、電磁場、電子和離子發射感興趣的從業者提供寶貴資源
- 特別提供有關電子設備(尤其是半導體設備)物理學、高低能粒子光學、微影技術、影像科學和數位影像處理的延伸文章