An Introduction to MixedSignal Ic Test and Measurement (Hardcover)
Mark Burns, Gordon W. Roberts
 出版商: Oxford University Press
 出版日期: 20001214
 售價: $1,200
 貴賓價: 9.8 折 $1,176
 語言: 英文
 頁數: 704
 裝訂: Hardcover
 ISBN: 0195140168
 ISBN13: 9780195140163
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商品描述
Descriptions:
Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixedsignal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixedsignal test engineers. The slow learning curve for mixedsignal test engineers is largely due to the shortage of written materials and universitylevel courses on the subject of mixedsignal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixedsignal automated test and measurement.This book was written in response to the shortage of basic course material for mixedsignal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, although not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuoustime and discretetime systems, as well as exposure to elementary probability and statistical concepts.
Table of Contents:
Chapter 1 presents an introduction to the context in which mixedsignal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements. Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15. Chapter 5 takes a closer look at the architecture of a generic mixedsignal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixedsignal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixedsignal tester. Coherent multitone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSPbased testing methodologies, which are at the core of many mixedsignal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSPbased testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economically using DSPbased testing. This chapter covers only nonsampled channels, consisting of combinations of opamps, analog filters, PGAs and other continuoustime circuits. Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binaryweighted, resistive ladder, pulse with modulation (PWM), and sigma delta architectures. Traditional measurements like INL, DNL and absolute error are discussed. Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested. Again, several different kinds of ADC's are studied, including binaryweighted, dualslope, flash, semiflash, and sigmadelta architectures. The weaknesses of each design are explained, as well as the common methodologies used to probe their weaknesses. Chapter 13 explores the gray art of mixedsignal DIB design. Topics of interest include component selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading. Chapter 13 also illustrates several common DIB circuits and their use in mixedsignal testing. Chapter 14 gives a brief introduction to some of the techniques for analog and mixedsignal design for test. There are fewer structured approaches for mixedsignal DfT than for purely digital DfT. The more common adhoc methods are explained, as well as some of the industry standards such as IEEE Std. 1149.1 and 1149.4. A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15. This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats. Datalogs, shmoo plots, and histograms are discussed. Also, statistical process control (SPC) is explained, including a discussion of process control metrics such as Cp and Cpk. Chapter 16 examines the economics of production testing. The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dualhead testing, multisite testing, and time to market. A test engineer's debugging skills heavily impacts time to market. Chapter 16 examines the test debugging process to attempt to set down some general guidelines for debugging mixedsignal test programs. Finally, emerging trends that affect test economics and test development time are presented in Chapter 16. Some or all these trends will shape the future course of mixedsignal test and measurement.