The Basics of Crystallography and Diffraction, 4/e (Paperback)

This book provides a clear and very broadly based introduction to crystallography, light, X-ray and electron diffraction - a knowledge which is essential to students in a wide range of scientific disciplines but which is otherwise generally covered in subject-specific and more mathematically detailed texts. The text is also designed to appeal to the more general reader since it shows, by historical and biographical references, how the subject has developed from the work and insights of successive generations of crystallographers and scientists.

The book shows how an understanding of crystal structures, both inorganic and organic may be built up from simple ideas of atomic and molecular packing. Beginning with (two dimensional) examples of patterns and tilings, the concepts of lattices, symmetry point and space groups are developed. 'Penrose' tilings and quasiperiodic structures are also included. The reciprocal lattice and its importance in understanding the geometry of light, X-ray and electron diffraction patterns is explained in simple terms, leading to Fourier analysis in diffraction, crystal structure determination, image formation and the diffraction-limited resolution in these techniques. Practical X-ray and electron diffraction techniques and their applications are described. A recurring theme is the common principles: the techniques are not treated in isolation.

The fourth edition has been revised throughout, and includes new sections on Fourier analysis, Patterson maps, direct methods, charge flipping, group theory in crystallography, and a new chapter on the description of physical properties of crystals by tensors (Chapter 14).

這本書提供了一個清晰且廣泛的晶體學、光學、X射線和電子繞射的介紹，這些知識對於各種科學學科的學生來說是必不可少的，但通常只在特定學科和更具數學細節的教材中涵蓋。該書也設計成適合一般讀者閱讀，因為它通過歷史和傳記的參考，展示了這個主題是如何從連續幾代的晶體學家和科學家的工作和洞察力中發展起來的。

該書展示了如何從原子和分子堆積的簡單概念出發，建立起對於無機和有機晶體結構的理解。從（二維）圖案和鋪砌的例子開始，發展出晶格、對稱點和空間群的概念。書中還包括了彭羅斯鋪砌和準周期結構。該書以簡單的術語解釋了倒易晶格及其在理解光學、X射線和電子繞射圖案的幾何學中的重要性，從而引出了繞射中的傅立葉分析、晶體結構確定、影像形成以及這些技術中的繞射極限分辨率。書中還描述了實際的X射線和電子繞射技術及其應用。一個重要的主題是共同的原則：這些技術並不是孤立地處理。

第四版在整體上進行了修訂，並新增了關於傅立葉分析、帕特森圖、直接法、電荷翻轉、晶體學中的群論以及通過張量描述晶體物理性質的新章節（第14章）。