Tsv 3D RF Integration: High Resistivity Si Interposer Technology
Ma, Shenglin, Jin, Yufeng
- 出版商: Elsevier
- 出版日期: 2022-04-27
- 售價: $10,310
- 貴賓價: 9.5 折 $9,795
- 語言: 英文
- 頁數: 292
- 裝訂: Quality Paper - also called trade paper
- ISBN: 0323996027
- ISBN-13: 9780323996020
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相關分類:
微電子學 Microelectronics
海外代購書籍(需單獨結帳)
相關主題
商品描述
TSV 3D RF Integration: High Resistivity Si Interposer Technology systematically introduces the design, process development and application verification of high-resistivity silicon interpose technology, addressing issues of high frequency loss and high integration level. The book includes a detailed demonstration of the design and process development of Hr-Si interposer technology, gives case studies, and presents a systematic literature review. Users will find this to be a resource with detailed demonstrations of the design and process development of HR-Si interposer technologies, including quality monitoring and methods to extract S parameters.
A series of cases are presented, including an example of an integrated inductor, a microstrip inter-digital filter, and a stacked patch antenna. Each chapter includes a systematic and comparative review of the research literature, offering researchers and engineers in microelectronics a uniquely useful handbook to help solve problems in 3D heterogenous RF integration oriented Hr-Si interposer technology.