Microstructural Characterization of Materials

Microstructural characterization is usually achieved by allowingsome form of probe to interact with a carefully prepared specimen.The most commonly used probes are visible light, X-ray radiation, ahigh-energy electron beam, or a sharp, flexible needle. These fourtypes of probe form the basis for optical microscopy, X-raydiffraction, electron microscopy, and scanning probemicroscopy.

Microstructural Characterization of Materials, 2nd Editionis an introduction to the expertise involved in assessing themicrostructure of engineering materials and to the experimentalmethods used for this purpose. Similar to the first edition, this2nd edition explores the methodology of materials characterizationunder the three headings of crystal structure, microstructuralmorphology, and microanalysis. The principal methods ofcharacterization, including diffraction analysis, opticalmicroscopy, electron microscopy, and chemical microanalyticaltechniques are treated both qualitatively and quantitatively. Anadditional chapter has been added to the new edition to coversurface probe microscopy, and there are new sections on digitalimage recording and analysis, orientation imaging microscopy,focused ion-beam instruments, atom-probe microscopy, and 3-D imagereconstruction. As well as being fully updated, this second editionalso includes revised and expanded examples and exercises, with asolutions manual available athttp://develop.wiley.co.uk/microstructural2e/

Microstructural Characterization of Materials, 2nd Editionwill appeal to senior undergraduate and graduate students ofmaterial science, materials engineering, and materials chemistry,as well as to qualified engineers and more advanced researchers,who will find the book a useful and comprehensive generalreference source.