Extended Defects in Semiconductors: Electronic Properties, Device Effects and Structures

D. B. Holt, B. G. Yacobi

  • 出版商: Cambridge
  • 出版日期: 2007-12-04
  • 售價: $2,400
  • 貴賓價: 9.8$2,352
  • 語言: 英文
  • 頁數: 644
  • 裝訂: Hardcover
  • ISBN: 0521819342
  • ISBN-13: 9780521819343
  • 相關分類: 半導體
  • 下單後立即進貨 (約5~7天)




Covering topics that are especially important in electronic device development, this book surveys the properties, effects, roles and characterization of structurally extended defects in semiconductors. The basic properties of extended defects are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.

Table of Contents

1. Semiconducting materials;

2. An introduction to extended defects;

3. Characterization of extended defects in semiconductors;

4. Core structures and mechanical effects of extended defects specific to semiconductors;

5. The electrical, optical and device effects of dislocations and grain boundaries;

6. Point defect materials problems.