Accelerated Stress Testing Handbook: Guide For Achieving Quality Products

Description:

Electrical Engineering Accelerated Stress Testing Handbook Guide for Achieving Quality Products As we move closer to a genuinely global economy, the pressure to develop highly reliable products on ever-tighter schedules will increase. Part of a designer’s "toolbox" for achieving product reliability in a compressed time frame should be a set of best practices for utilizing accelerated stress testing (AST). The Accelerated Stress Testing Handbook delineates a core set of AST practices as part of an overall methodology for enhancing hardware product reliability. The techniques presented will teach readers to identify design deficiencies and problems with component quality or manufacturing processes early in the product’s life, and then to take corrective action as quickly as possible. A wide array of case studies gleaned from leading practitioners of AST supplement the theory and methodology, which will provide the reader with a more concrete idea of how AST truly enhances quality in a reduced time frame. Important topics covered include:

• Theoretical basis for AST
• General AST best practices
• AST design and manufacturing processes
• AST equipment and techniques
• AST process safety qualification

In this handbook, AST cases studies demonstrate thermal, vibration, electrical, and liquid stress application; failure mode analysis; and corrective action techniques. Individuals who would be interested in this book include: reliability engineers and researchers, mechanical and electrical engineers, those involved with all facets of electronics and telecommunications product design and manufacturing, and people responsible for implementing quality and process improvement programs.

 

Table of Contents:

Foerword (F. Ianna).

Preface.

Acknowledgments.

OVERVIEW.

Introduction (H. Chan and P. Englert).

Principles of Stress Testing (H. Chan and P. Englert).

PROCESS AND GUIDELINES.

Stress Testing Program: Generic Processes (H. Chan and P. Englert).

Stress Testing Program Subprocesses (H. Chan and P. Englert).

Guidelines for Design and Manufacturing Stress Testing (H. Chan and P. Englert).

THEORY.

Economic and Optimization (H. Chan and P. Englert).

Reliability Growth (C. Seusy).

Overview of the Failure Analysis Process for Electrical Components (G. Pfeiffer).

EQUIPMENT AND TECHNIQUES.

Accelerated Stress Testing Equipment and Techniques (C. Felkins).

Vibration and Shock Inputs Identify Some Failure Modes (W. Tustin).

Relative Effectiveness of Thermal Cycling Versus Burn-In (K. Lo and F. LoVasco).

Accelerated Qualification of Electronic Assemblies Under Combined Temperature Cycling and Vibration Environments: Is Miner's Hypothesis Valid (K. Upadhyayula and A. Dasgupta)?

Liquid Environmental Stress Testing (LEST) (P. Englert).

Safety Qualification of Stress Testing (S. Rajaram).

BEST PRACTICES CASE STUDIES IN COMPUTER, COMMUNICATIONS, AND OTHER INDUSTRIES.

Production Ast with Computers Using the Taguchi Method (D. Pachuki).

Design Ast with Vendor Electronics (C. Schinner).

Design and Production Ast with Power Supplies (D. Dalland).

Design and Production Ast with Computers (E. Kyser).

Qualifications and Production Sampling Ast with Printed Circuit Boards (H. McLean).

Manufacturing Ast with Telecommunication Products (T. Parker and G. Harrison).

Productionn Ast with Computer Disks.

Benchmarking (H. Malec).

Glossary of Stress Testing Terminology.

Bibliography.

Index.

Epilogue.

About the Editors.

描述：
電機工程加速應力測試手冊：實現優質產品的指南。隨著我們逐漸走向真正的全球經濟，開發高度可靠的產品並在越來越緊迫的時間表上完成的壓力將增加。設計師在縮短時間框架內實現產品可靠性的“工具箱”之一應該是一套最佳實踐，用於利用加速應力測試（AST）。《加速應力測試手冊》將作為增強硬件產品可靠性整體方法論的一部分，詳細介紹了一套核心的AST實踐。所介紹的技術將教讀者在產品的早期階段識別設計缺陷和元件質量或製造過程中的問題，並盡快採取糾正措施。從AST的領先實踐者那裡獲得的大量案例研究補充了理論和方法論，這將使讀者對AST如何在縮短的時間框架內真正提高質量有更具體的了解。重要的主題包括：
- AST的理論基礎
- 一般AST最佳實踐
- AST設計和製造過程
- AST設備和技術
- AST過程安全資格認證

在這本手冊中，AST案例研究展示了熱、振動、電氣和液體應力應用、故障模式分析和糾正措施技術。對這本書感興趣的人包括：可靠性工程師和研究人員、機械和電氣工程師、涉及電子和電信產品設計和製造各個方面的人員，以及負責實施質量和流程改進計劃的人員。

目錄：
- 前言（F. Ianna）
- 前言
- 致謝
- 概述
- 簡介（H. Chan和P. Englert）
- 應力測試原則（H. Chan和P. Englert）
- 流程和指南
- 應力測試計劃：通用流程（H. Chan和P. Englert）
- 應力測試計劃子流程（H. Chan和P. Englert）
- 設計和製造應力測試指南（H. Chan和P. Englert）
- 理論
- 經濟和優化（H. Chan和P. Englert）
- 可靠性增長（C. Seusy）
- 電子元件故障分析過程概述（G. Pfeiffer）
- 設備和技術
- 加速應力測試設備和技術（C. Felkins）
- 振動和衝擊輸入識別一些故障模式（W. Tustin）
- 熱循環與老化測試的相對效果（K. Lo和F. LoVasco）