Thermal-Aware Testing of Digital VLSI Circuits and Systems

Santanu Chattopadhyay

  • 出版商: CRC
  • 出版日期: 2018-04-25
  • 售價: $2,150
  • 貴賓價: 9.5$2,043
  • 語言: 英文
  • 頁數: 138
  • 裝訂: Hardcover
  • ISBN: 0815378823
  • ISBN-13: 9780815378822
  • 相關分類: VLSI
  • 下單後立即進貨 (約2~4週)



The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips.