Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
暫譯: 先進材料特性分析：基本原則、新穎應用與未來方向

Name: Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Price: 2308 TWD
Availability: OnlineOnly
Author: Kumar, Ch Sateesh, Singh, M. Muralidhar, Krishna, Ram
ISBN: 1032375116

Kumar, Ch Sateesh, Singh, M. Muralidhar, Krishna, Ram

出版商: CRC
出版日期: 2024-11-29
售價: $2,430
貴賓價: 9.5 折 $2,308
語言: 英文
頁數: 130
裝訂: Quality Paper - also called trade paper
ISBN: 1032375116
ISBN-13: 9781032375113
相關分類: 材料科學 Meterials

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商品描述

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

商品描述(中文翻譯)

本書涵蓋了工程中常用的先進材料的各種特性表徵方法，包括對設備工作原理和適用性的理解。主要介紹的儀器包括X射線衍射（X-Ray Diffraction）、近場光學顯微鏡拉曼光譜（NSOM Raman）、X射線光電子能譜（X-Ray Photo Spectroscopy）、紫外-可見-近紅外光譜儀（UV-VIS-NIR Spectrosphotometer）、傅立葉變換紅外光譜（FTIR Spectroscopy）等。