Precision Measurement of Microwave Thermal Noise

Comprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties

Precision Measurement of Microwave Thermal Noise presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author's expertise of calculations to aid understanding of the challenges and solutions.

The text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed.

Specific topics and concepts covered in the text include:

• Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources
• Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies
• On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties
• Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio

Containing some introductory material, Precision Measurement of Microwave Thermal Noise is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.

「微波精密測量」是一本全面介紹精密噪音測量基礎和分析以及其不確定性的資源。《微波熱噪音的精密測量》介紹了在微波頻率下進行精確測量的基本知識，並指導讀者如何評估此類測量的不確定性。重點介紹了美國國家標準與技術研究所（NIST）使用的測量方法，但一般原則和方法在各種應用中都很有用。讀者將學習如何利用尊重作者的計算專業知識進行準確的微波噪音測量，以幫助理解挑戰和解決方案。

本書涵蓋了分析測量所需的背景知識，以及校準射頻和微波輻射計的標準。它還涵蓋了噪音溫度（功率）的測量以及放大器和晶體管的噪音特性。除了常見的室溫雙口設備外，還討論了低溫設備和多口放大器。最後，還考慮了這些實驗室測量與遙感測量（尤其是太空測量）的聯繫，並討論了實驗室測量對遙感應用的可能貢獻。

本書涵蓋的具體主題和概念包括：
- 噪音溫度標準，包括環境標準、熱（爐）標準、低溫標準和其他標準和噪音源
- 放大器噪音，包括噪音參數的定義、噪音參數的測量、噪音參數測量的不確定性分析以及模擬和策略
- 晶片上噪音測量，包括晶片上微波形式主義、噪音溫度、晶片上噪音參數測量以及不確定性
- 多口放大器，包括形式主義和噪音矩陣、多口噪音圖的定義以及信噪比的降低

《微波熱噪音的精密測量》包含一些入門材料，對於高級學生和所有在微波噪音測量領域工作（或進入）的專業人士來說，無論是在標準實驗室、商業實驗室還是學術研究中，都是一個寶貴的資源。

James Randa received the Ph.D. degree in Theoretical Physics from the University of Illinois at Urbana-Champaign, USA. After a series of postdoctoral and temporary faculty positions, he joined NIST, where he worked for about 25 years, leading the Noise Project for much of that time. Since his retirement he has continued to work on topics in noise on a part-time basis, as a contractor and/or a guest researcher at NIST. He is a Senior Member of the IEEE.

James Randa在美國伊利諾伊大學厄巴納-香檳分校獲得理論物理學博士學位。在一系列的博士後和臨時教職之後，他加入了NIST，在那裡工作了大約25年，其中大部分時間負責噪聲項目。退休後，他以兼職的方式繼續從事噪聲相關的研究，擔任NIST的承包商和/或客座研究員。他是IEEE的高級會員。