Iot System Testing: An Iot Journey from Devices to Analytics and the Edge
暫譯: 物聯網系統測試:從設備到分析與邊緣的物聯網之旅

Hagar, Jon Duncan

  • 出版商: Apress
  • 出版日期: 2022-09-17
  • 售價: $2,330
  • 貴賓價: 9.5$2,214
  • 語言: 英文
  • 頁數: 324
  • 裝訂: Quality Paper - also called trade paper
  • ISBN: 1484282752
  • ISBN-13: 9781484282755
  • 相關分類: 物聯網 IoT
  • 海外代購書籍(需單獨結帳)

相關主題

商品描述

To succeed, teams must assure the quality of IoT systems. The world of technology continually moves from one hot area to another; this book considers the next explosion--of IoT--from a quality testing viewpoint. You'll first gain an introduction to the Internet of Things (IoT), V&V, and testing. Next, you'll be walked through IoT test planning and strategy over the full life cycle, including the impact of data analytics and AI. You will then delve deeper into IoT security testing and various test techniques, patterns, and more. This is followed by a detailed study of IoT software test lab architecture environments and how to automate IoT tests. There are many options for testing IoT qualities based on the criticality of the software and risks involved; each option has positives, negatives, as well as cost and schedule impacts. The book will guide start-up and experienced teams into these paths and help you to improve the testing and quality assessment of IoT systems. What You Will Learn
  • Understand IoT software test architecture and planning
  • Master IoT security testing and test techniques
  • Study IoT test lab automation and architectures
  • Review the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V
Who This Book Is ForReaders with basic knowledge of software developers who want to learn more about IoT testing and its intricacies, as well as companies moving into the domain of IoT, and even those already deep into the IoT domain will benefit from this book.

商品描述(中文翻譯)

為了成功,團隊必須確保物聯網(IoT)系統的品質。科技世界不斷從一個熱門領域轉向另一個;本書從品質測試的角度考慮下一個爆炸性領域——物聯網。您將首先獲得物聯網(IoT)、驗證與確認(V&V)及測試的介紹。接下來,您將了解物聯網測試計劃和策略,涵蓋整個生命週期,包括數據分析和人工智慧(AI)的影響。然後,您將深入探討物聯網安全測試及各種測試技術、模式等。接下來是對物聯網軟體測試實驗室架構環境的詳細研究,以及如何自動化物聯網測試。根據軟體的關鍵性和相關風險,測試物聯網品質有許多選擇;每個選擇都有其優缺點,以及成本和時間表的影響。本書將指導初創和經驗豐富的團隊進入這些路徑,幫助您改善物聯網系統的測試和品質評估。

您將學到什麼


  • 了解物聯網軟體測試架構和計劃

  • 掌握物聯網安全測試和測試技術

  • 研究物聯網測試實驗室自動化和架構

  • 回顧物聯網安全、數據分析、人工智慧、神經網絡及可靠性在測試和驗證與確認中的必要性

本書適合誰
本書適合具有基本知識的軟體開發人員,想要深入了解物聯網測試及其複雜性的人士,以及進入物聯網領域的公司,甚至是已經深入物聯網領域的人士,都將從本書中受益。

作者簡介

Jon Hagar is a senior tester with 40 years' experience in software development and testing. He has supported software product design, integrity, integration, reliability, measurement, verification, validation, and testing on various projects and software domains (environments). He has an M.S. degree in Computer Science with specialization in Software Engineering and Testing from Colorado State University and a B.S. Degree in Math with specialization in Civil Engineering and Software from Metropolitan State College of Denver, Colorado. Jon has worked in business analysis, systems, and software engineering, specializing in testing, verification and validation. Projects he has supported include the domains of embedded, mobile devices, IoT, PC/IT systems, and test lab and tool development. Currently, Jon works as a consultant for Grand Software Testing, LLC.Jon has taught hundreds of classes and tutorials in software engineering, systems engineering, and testing throughout the industry and universities. He has published numerous articles on software reliability, testing, test tools, formal methods, mobile, and embedded systems. He is the author of the book Software Test Attacks to Break Mobile and Embedded Devices and contributor to books on Agile testing and test automation. Jon makes presentations regularly at industry working groups and conferences. Jon most recently has been working on: combinatorial testing, test automation, handheld-mobile devices, IoT security testing, and error taxonomies for IoT/embedded systems.

作者簡介(中文翻譯)

Jon Hagar 是一位擁有 40 年軟體開發與測試經驗的資深測試工程師。他曾在各種專案和軟體領域(環境)中支持軟體產品的設計、完整性、整合性、可靠性、測量、驗證、驗證及測試。他擁有科羅拉多州立大學的計算機科學碩士學位,專攻軟體工程與測試,以及科羅拉多州丹佛市的都市州立學院的數學學士學位,專攻土木工程與軟體。Jon 在商業分析、系統和軟體工程方面工作,專注於測試、驗證和驗證。他支持的專案包括嵌入式系統、行動裝置、物聯網(IoT)、PC/IT 系統以及測試實驗室和工具開發。目前,Jon 擔任 Grand Software Testing, LLC 的顧問。

Jon 在業界和大學教授過數百門軟體工程、系統工程和測試的課程和教程。他發表了許多有關軟體可靠性、測試、測試工具、形式方法、行動和嵌入式系統的文章。他是《Software Test Attacks to Break Mobile and Embedded Devices》一書的作者,並為有關敏捷測試和測試自動化的書籍貢獻內容。Jon 定期在業界工作小組和會議上進行演講。最近,Jon 正在研究的主題包括:組合測試、測試自動化、手持行動裝置、物聯網安全測試以及物聯網/嵌入式系統的錯誤分類。

最後瀏覽商品 (20)