Machine Learning Support for Fault Diagnosis of System-On-Chip
暫譯: 以 Machine Learning 支援 System-on-Chip 故障診斷

本書提供一份最先進的指南，介紹已證實能有效診斷電子電路與系統故障的 Machine Learning (ML) 技術。所討論的方法可用於製造完成後的大量診斷，也可用於客戶退貨品的故障診斷。讀者將能夠處理大量且具有洞察價值的測試資料；若沒有這些方法，這些資料便無法以有效率且及時的方式加以運用。

作者先介紹故障診斷與機器學習的背景，接著說明並應用 ML 領域中的最佳化技術，以解決電子系統設計與製造領域中的故障診斷問題。這些技術可用於邏輯電路或類比電路的故障隔離、電路板層級的故障診斷，甚至晶圓層級的故障群聚識別。本書也透過評估指標與工業案例研究，強調採用 ML 式診斷技術的實用性與效益。

Patrick GIRARD received a M.Sc. degree in Electrical Engineering and a Ph.D. degree in Microelectronics from the University of Montpellier, France, in 1988 and 1992 respectively. He also received the "Habilitation à Diriger des Recherches" degree from the University of Montpellier, France, in 2003. He is currently Research Director at CNRS (French National Center for Scientific Research) and works in the Microelectronics Department of the Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM) - France.

Patrick Girard is Coordinator of the International Research Project « INSIMIA » (French-Italian Research Program on the Integrity of Integrated Systems in the Era of Artificial Intelligence) created in 2021 by the CNRS and the University of Montpellier, France, with the Politecnico di Torino, Italy. Since 2006, he is deputy director of the French scientific network dedicated to research in the fields of System-on-Chip, Embedded Systems and Connected Objects(SOC2), a network composed of 1400 researchers. From 2010 to 2014, he was Director of the Microelectronics Department at LIRMM, at that time composed of about 100 people. His research interests include all aspects of digital and memory circuit test and reliability, with emphasis on critical constraints such as timing and power. Robust design of neuromorphic circuits, test of approximate circuits, as well as machine learning for fault diagnosis are also part of his new research activities.

Patrick Girard is Technical Activities Chair of the Test Technology Technical Council (TTTC) of the IEEE Computer Society. From 2006 to 2010, he was Vice-Chair of the European TTTC (ETTTC) of the IEEE Computer Society. He has served on numerous conference committees including ACM/IEEE Design Automation Conference (DAC), ACM/IEEE Design Automation and Test in Europe (DATE), IEEE International Test Conference (ITC), IEEE VLSI Test Symposium (VTS), IEEE European Test Symposium (ETS), IEEE Asian Test Symposium (ATS), IEEE Computer Society Annual Symposium on VLSI (ISVLSI), and IEEE International NEWCAS Conference.

Patrick Girard was the founder and Editor-in-Chief of the ASP Journal of Low Power Electronics (JOLPE). He is an Associate Editor of the IEEE Transactions on Emerging Topics in Computing, the IEEE Transactions on Circuits and Systems I: Regular Papers, the IEEE Transactions on Circuits and Systems II: Express Briefs, and the Journal of Electronic Testing (JETTA - Springer). He was formerly an Associate Editor of the IEEE Transactions on VLSI Systems, IEEE Transactions on Computers, and IEEE Transactions on Computer-Aided Design of Circuits and Systems.

Patrick Girard has been involved in several (34) European research projects (ESPRIT III ATSEC, EUREKA MEDEA, MEDEA+ ASSOCIATE, IST MARLOW, MEDEA+ NanoTEST, CATRENE TOETS, ENIAC ELESIS, CATRENE MASTER_3D, PENTA HADES), national research projects (ANR, FUI), and industrial research projects with major companies like Infineon Technologies, Intel, Atmel, ST-Ericsson, STMicroelectronics, etc.

Patrick Girard has supervised 44 PhD dissertations, and has published 12 books or book chapters, 90 journal papers, and more than 250 conference and symposium papers. He is co-author of 5 patents. He is a Fellow of the IEEE and a Golden Core Member of the IEEE Computer Society.

Shawn Blanton is Joseph F. and Nancy Keithley Professor of Electrical and Computer Engineering at Carnegie Mellon University. In 1995 he received his Ph.D. in Electrical Engineering and Computer Science from the University of Michigan, Ann Arbor. His personal research interests include various aspects of integrated system testing and diagnosis, and the development of design methodologiesand tools for securing hardware systems. He has consulted for various companies, and is the founder of TestWorks, a Carnegie Mellon University spinout focused on information extraction from IC test data. He received a Career Award from the National Science Foundation in 1997, and IBM Faculty Partnership Awards in 2005 and 2006. He has given over 100 invited talks at universities and companies and is the recipient of several best-paper awards. He has published nearly 200 refereed conference and journal papers and has 10 U.S. patents or patent applications filed. He has served on various technical program committees and chaired the 2011 program for the International Test Conference. Dr. Blanton is a fellow of the IEEE and senior member of the ACM.

Dr. Blanton has served as the Interim Vice Provost for Diversity, Equity, and Inclusion for Carnegie Mellon University 2020-21. In this interim role, he focused on diversifyingthe graduate student and faculty populations across the university, along with enhancing and initiating win-win relationships with the Pittsburgh region. He also served as the Acting Associate Dean for Diversity and Inclusion for the College of Engineering from 2019 to 2020. In this role, he was responsible for developing and executing a DEI strategic plan for the college. Dr. Blanton currently serves as the Associate Head of Research and is responsible for developing and executing department research strategies.

Blanton is also significantly involved in the recruitment of underrepresented candidates for graduate school. Most of his activities center on direct recruitment at the annual conventions of various engineering societies that include the National Society of Black Engineers (NSBE), Society of Hispanic Professional Engineers and the American Indian Science and Engineering Society, and he spearheaded the University's efforts for the 2006, 2012 and 2018 NSBE conventions in Pittsburgh. In 2006, Blanton was awarded an Emerald Award for outstanding leadership in recruiting and mentoring minorities for advanced degrees in science and technology, and in 2021 he was awarded the Lifetime Achievement award from the National Society of Black Engineers for exhibiting career technical excellence and leadership in higher education in a career spanning several years.

Li-C. Wang is a professor of the Electrical and Computer Engineering Department at University of California, Santa Barbara (UCSB), USA. He received his PhD in 1996 from the University of Texas at Austin, and was previously with Motorola PowerPC Design Center. He joined UCSB in 2000. In the last two decades, his research focused on investigating how machine learning could be applied in electronic design and test flows. Earlier, his research focused on a variety of topics in Electronic Design Automation and Test, including microprocessor test and verification, statistical timing analysis, defect-oriented testing, and Boolean Satisfiability (SAT) solvers. He received 9 best paper awards and 2 honorable mentioned paper awards from major conferences, including the best paper award from International Test Conference (ITC) 2020 and from VLSI Test Symposium 2016. He is the recipient of the 2010 Technical Excellence Award from Semiconductor Research Corporation (SRC) for his research contributions in data mining for test and validation. He is the recipient of the 2017 TTTC Bob Madge Innovation Award. He is an IEEE fellow. He served as the Program Chair for ITC 2016, and as the General Chair for ITC 2017 and ITC 2018. He helped found the ITC-Asia conference in 2017.

Patrick GIRARD 於 1988 年及 1992 年分別取得法國 Montpellier 大學電機工程理學碩士學位與微電子學博士學位。2003 年，他亦取得法國 Montpellier 大學的「Habilitation à Diriger des Recherches」學位。目前，他是 CNRS（法國國家科學研究中心）的研究主任，並任職於法國 Montpellier 資訊、機器人與微電子實驗室（Laboratory of Informatics, Robotics and Microelectronics of Montpellier，LIRMM）的微電子部門。

Patrick Girard 是國際研究計畫「INSIMIA」（人工智慧時代整合系統完整性的法義研究計畫）的協調人。該計畫由法國 CNRS、Montpellier 大學與義大利 Politecnico di Torino 於 2021 年共同成立。自 2006 年起，他擔任法國科學研究網路 SOC2 的副主任；該網路專注於 System-on-Chip、Embedded Systems 與 Connected Objects 領域的研究，成員包括 1,400 名研究人員。2006 年至 2010 年間，他擔任 IEEE Computer Society 歐洲 TTTC（ETTTC）的副主席。2010 年至 2014 年，他擔任 LIRMM 微電子部門主任，當時該部門約有 100 名成員。他的研究興趣涵蓋數位電路與記憶體電路測試及可靠性的各個面向，尤其著重於時序與功耗等關鍵限制。此外，類神經電路的強健設計、近似電路測試，以及利用機器學習進行故障診斷，也屬於他近期研究活動的一部分。

Patrick Girard 是 IEEE Computer Society 測試技術技術委員會（Test Technology Technical Council，TTTC）的技術活動主席。2006 年至 2010 年間，他擔任 IEEE Computer Society 歐洲 TTTC（ETTTC）的副主席。他曾參與多個會議的籌辦委員會，包括 ACM/IEEE Design Automation Conference（DAC）、ACM/IEEE Design Automation and Test in Europe（DATE）、IEEE International Test Conference（ITC）、IEEE VLSI Test Symposium（VTS）、IEEE European Test Symposium（ETS）、IEEE Asian Test Symposium（ATS）、IEEE Computer Society Annual Symposium on VLSI（ISVLSI），以及 IEEE International NEWCAS Conference。

Patrick Girard 是 ASP Journal of Low Power Electronics（JOLPE）的創辦人兼總編輯。他目前擔任 IEEE Transactions on Emerging Topics in Computing、IEEE Transactions on Circuits and Systems I: Regular Papers、IEEE Transactions on Circuits and Systems II: Express Briefs，以及 Journal of Electronic Testing（JETTA，由 Springer 出版）的副編輯。他過去也曾擔任 IEEE Transactions on VLSI Systems、IEEE Transactions on Computers，以及 IEEE Transactions on Computer-Aided Design of Circuits and Systems 的副編輯。

Patrick Girard 曾參與多項歐洲研究計畫（共 34 項），包括 ESPRIT III ATSEC、EUREKA MEDEA、MEDEA+ ASSOCIATE、IST MARLOW、MEDEA+ NanoTEST、CATRENE TOETS、ENIAC ELESIS、CATRENE MASTER_3D 與 PENTA HADES；也曾參與國家級研究計畫（ANR、FUI），以及與 Infineon Technologies、Intel、Atmel、ST-Ericsson、STMicroelectronics 等主要企業合作的工業研究計畫。

Patrick Girard 指導過 44 篇博士論文，並出版 12 本書籍或書籍章節、90 篇期刊論文，以及超過 250 篇會議與研討會論文。他是 5 項專利的共同發明人。他是 IEEE Fellow，也是 IEEE Computer Society 的 Golden Core Member。

Shawn Blanton 是 Carnegie Mellon University 電機與電腦工程系 Joseph F. and Nancy Keithley Professor。1995 年，他取得 University of Michigan, Ann Arbor 的電機工程與電腦科學博士學位。他的個人研究興趣包括整合系統測試與診斷的各個面向，以及用於確保硬體系統安全性的設計方法與工具開發。他曾為多家企業提供顧問服務，也是 TestWorks 的創辦人；TestWorks 是 Carnegie Mellon University 的衍生公司，專注於從 IC 測試資料中擷取資訊。1997 年，他獲得 National Science Foundation 的 Career Award，並於 2005 年及 2006 年獲得 IBM Faculty Partnership Awards。他曾在大學及企業發表超過 100 場受邀演講，並獲得多項最佳論文獎。他已發表近 200 篇經同儕審查的會議與期刊論文，並擁有 10 項美國專利或已提出申請的專利。他曾任職於多個技術計畫委員會，並擔任 2011 年 International Test Conference 的計畫主席。Blanton 博士是 IEEE Fellow，也是 ACM Senior Member。

2020 年至 2021 年，Blanton 博士擔任 Carnegie Mellon University 多元、公平與共融（Diversity, Equity, and Inclusion）的代理副教務長。在此代理職務期間，他致力於提升全校研究生與教職員組成的多元性，同時強化並建立與 Pittsburgh 地區的互利合作關係。2019 年至 2020 年，他也擔任 College of Engineering 多元與共融事務的代理副院長。在該職務中，他負責制定並執行學院的 DEI 策略計畫。目前，Blanton 博士擔任研究副系主任，負責制定並執行系所研究策略。

Blanton 也積極參與代表性不足族群申請研究所的招募工作。他的大多數活動集中於各工程學會年度大會中的直接招募，相關組織包括 National Society of Black Engineers（NSBE）、Society of Hispanic Professional Engineers，以及 American Indian Science and Engineering Society。他更主導了 Carnegie Mellon University 參與 2006 年、2012 年及 2018 年 NSBE Pittsburgh 大會的相關工作。2006 年，Blanton 因在招募與指導少數族群攻讀科學與技術領域高等學位方面展現卓越領導力，而獲頒 Emerald Award；2021 年，他因多年職涯中展現卓越的技術成就，以及在高等教育領域的領導力，獲得 National Society of Black Engineers 頒發的 Lifetime Achievement Award。

Li-C. Wang 是美國 University of California, Santa Barbara（UCSB）電機與電腦工程系教授。他於 1996 年取得 University of Texas at Austin 的博士學位，過去曾任職於 Motorola PowerPC Design Center，並於 2000 年加入 UCSB。過去二十年來，他的研究主要探討如何將機器學習應用於電子設計與測試流程。更早期的研究則涵蓋 Electronic Design Automation 與測試領域的多項主題，包括微處理器測試與驗證、統計時序分析、缺陷導向測試，以及 Boolean Satisfiability（SAT）求解器。

他曾從重要國際會議獲得 9 項最佳論文獎與 2 項最佳論文佳作獎，其中包括 2020 年 International Test Conference（ITC）最佳論文獎，以及 2016 年 VLSI Test Symposium 最佳論文獎。他因在測試與驗證資料探勘方面的研究貢獻，獲得 Semiconductor Research Corporation（SRC）於 2010 年頒發的 Technical Excellence Award。他也是 2017 年 TTTC Bob Madge Innovation Award 的得主，並為 IEEE Fellow。他曾擔任 ITC 2016 的計畫主席，以及 ITC 2017 與 ITC 2018 的大會主席。2017 年，他協助創辦 ITC-Asia conference。