Transmission Electron Microscopy: The Companion Volume
暫譯: 透射電子顯微鏡：伴隨卷

Name: Transmission Electron Microscopy: The Companion Volume
Price: 4142 TWD
Availability: PreOrder
Author: Carter, C. Barry, Williams, David B.
ISBN: 303180788X

Carter, C. Barry, Williams, David B.

出版商: Springer
出版日期: 2025-07-22
售價: $4,360
貴賓價: 9.5 折 $4,142
語言: 英文
頁數: 809
裝訂: Hardcover - also called cloth, retail trade, or trade
ISBN: 303180788X
ISBN-13: 9783031807886

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商品描述

This volume is the second edition of Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry building upon the foundation of the first edition while significantly expanding and updating its scope. The book remains true to its mission of being a student-focused textbook, designed to complement the bestselling Transmission Electron Microscopy: A Textbook for Materials Science, by Williams and Carter.

As a comprehensive guide to advanced topics in TEM (Transmission Electron Microscopy), this companion covers the latest technological advancements, new applications, and enduring techniques essential to the field. The chapters explore rapidly evolving areas like in-situ experiments, electron diffraction, STEM, energy-filtered TEM (EFTEM) imaging, holography, and tomography. It also emphasizes both theoretical and practical aspects of TEM, with expert insights from world-renowned researchers.

Since the first edition of this book, the field of TEM has advanced significantly, particularly in the realms of computer-controlled instrumentation and data acquisition. This edition reflects the maturation of techniques like cryogenic electron microscopy, holography, and ptychography, all of which are now more accessible due to software-driven innovations.

As in the first edition, this volume includes two sets of questions at the end of each chapter: one for self-assessment and another suitable for homework assignments. The text encourages a thoughtful, interactive learning process, prompting students to engage deeply with the material and further explore scientific literature and resources.

Richly illustrated with high-quality color figures, this new edition offers unparalleled visual representations of the complex phenomena under study. It provides clarity on key challenges and pitfalls in modern TEM techniques, making it an essential resource for both novice and experienced microscopists.

In keeping with its role as a textbook, this companion remains an important resource for graduate students and professionals in materials science, offering detailed discussion and practical guidance on a wide array of TEM technologies and methodologies.

商品描述(中文翻譯)

本卷是《傳輸電子顯微鏡：衍射、成像與光譜學》的第二版，建立在第一版的基礎上，同時顯著擴展和更新其範疇。這本書仍然忠於其作為以學生為中心的教科書的使命，旨在補充威廉斯（Williams）和卡特（Carter）所著的暢銷書《傳輸電子顯微鏡：材料科學教科書》。

作為一本涵蓋 TEM（傳輸電子顯微鏡）進階主題的綜合指南，本書伴隨著最新的技術進展、新應用和該領域必不可少的持久技術。各章探討了快速發展的領域，如原位實驗、電子衍射、掃描透射電子顯微鏡（STEM）、能量過濾傳輸電子顯微鏡（EFTEM）成像、全息術和斷層成像。它還強調了 TEM 的理論和實踐兩個方面，並提供來自世界知名研究者的專家見解。

自本書第一版以來，TEM 領域已顯著進步，特別是在計算機控制儀器和數據獲取方面。本版反映了如低溫電子顯微鏡、全息術和相位成像等技術的成熟，這些技術因軟體驅動的創新而變得更加可及。

與第一版相同，本卷在每章結尾包含兩組問題：一組用於自我評估，另一組適合作為家庭作業。文本鼓勵深思熟慮的互動學習過程，促使學生深入參與材料並進一步探索科學文獻和資源。

本新版本以高品質的彩色圖形豐富插圖，提供對所研究的複雜現象的無與倫比的視覺表現。它清晰地闡明了現代 TEM 技術中的主要挑戰和陷阱，使其成為新手和經驗豐富的顯微鏡學家必備的資源。

作為教科書的一部分，本書伴隨著仍然是材料科學研究生和專業人士的重要資源，提供對各種 TEM 技術和方法的詳細討論和實用指導。

作者簡介

C. Barry Carter has been one of four CINT Distinguished Affiliate Scientists at Sandia and Los Alamos National Laboratories (2012-). He is a Research Professor in Chemical and Biomolecular Engineering and an Emeritus Professor in Materials Science and Engineering at the University of Connecticut having previously been the Inaugural 3M Harry Helzer Endowed Chair at the University of Minnesota (1991-2007) and a Professor at Cornell University (1079-1991). He served as the Editor-in-Chief of the Journal of Materials Science for 21 years from 2004-2024.

Dave Williams is emeritus dean of engineering and at The Ohio State University, where he is building global university-industry partnerships to support Starlab, a commercial space station planned for launch in 2028-29. Starlab is a joint venture between Voyager Space, Airbus and Mitsubishi Corporation along with Hilton, Northrop Grumman, Palantir and MDA to design build and manage the station. Starlab's Ground Location (US) is at Ohio State University's airport which will be the site of the George Washington Carver (Space) Science Park.

作者簡介(中文翻譯)

C. Barry Carter 是桑迪亞國家實驗室和洛斯阿拉莫斯國家實驗室的四位 CINT 傑出附屬科學家之一（2012年至今）。他是康乃爾大學化學與生物分子工程的研究教授，以及材料科學與工程的名譽教授，曾擔任明尼蘇達大學的首任 3M Harry Helzer 受贈講座教授（1991-2007）和康奈爾大學的教授（1979-1991）。他於 2004 年至 2024 年擔任《材料科學期刊》的主編，長達 21 年。

Dave Williams 是俄亥俄州立大學的名譽工程院院長，他正在建立全球大學與產業的夥伴關係，以支持 Starlab，這是一個計劃於 2028-29 年發射的商業太空站。Starlab 是 Voyager Space、空中巴士和三菱集團的合資企業，還包括希爾頓、諾斯羅普·格魯曼、Palantir 和 MDA，負責設計、建造和管理該太空站。Starlab 的地面位置（美國）位於俄亥俄州立大學的機場，該地將成為喬治·華盛頓·卡佛（太空）科學公園的所在地。