Database and Expert Systems Applications: 36th International Conference, Dexa 2025, Bangkok, Thailand, August 25-27, 2025, Proceedings, Part I
暫譯: 資料庫與專家系統應用:第36屆國際會議,DEXA 2025,泰國曼谷,2025年8月25-27日,會議論文集,第一部分
Wrembel, Robert, Kotsis, Gabriele, Tjoa, A. Min
- 出版商: Springer
- 出版日期: 2025-08-22
- 售價: $3,210
- 貴賓價: 9.5 折 $3,050
- 語言: 英文
- 頁數: 383
- 裝訂: Quality Paper - also called trade paper
- ISBN: 3032020484
- ISBN-13: 9783032020482
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相關分類:
Data-mining、Machine Learning
海外代購書籍(需單獨結帳)
相關主題
商品描述
The two-volume set LNCS 16046-16047 constitutes the proceedings of the 36th International Conference on Database and Expert Systems Applications, DEXA 2025, held in Bangkok, Thailand, in August 25-27, 2025.
The 35 full and 22 short papers presented in this set together with 3 invited talks were carefully reviewed and selected from 123 submissions. They were organized in topical sections as follows:
Part I: Industrial Keynote; Invited Talks; Large Language Models; Data Quality; Machine Learning /Artificial Intelligence Applications; Classification Techniques.
Part II: Image Processing, Analytics, and Vision Systems; Recommender Techniques; Data Integration; Optimisation Methods; Graph Applications; Analytics; Security/Privacy; Benchmarks and Surveys.
The 35 full and 22 short papers presented in this set together with 3 invited talks were carefully reviewed and selected from 123 submissions. They were organized in topical sections as follows:
Part I: Industrial Keynote; Invited Talks; Large Language Models; Data Quality; Machine Learning /Artificial Intelligence Applications; Classification Techniques.
Part II: Image Processing, Analytics, and Vision Systems; Recommender Techniques; Data Integration; Optimisation Methods; Graph Applications; Analytics; Security/Privacy; Benchmarks and Surveys.
商品描述(中文翻譯)
這兩卷的 LNCS 16046-16047 是第36屆國際資料庫與專家系統應用會議(DEXA 2025)的會議論文集,會議於2025年8月25日至27日在泰國曼谷舉行。這套論文集包含35篇完整論文和22篇短文,連同3場邀請演講,這些論文經過仔細審查和選擇,從123篇投稿中挑選出來。論文被組織成以下主題部分:
第一部分:產業主題演講;邀請演講;大型語言模型;資料品質;機器學習/人工智慧應用;分類技術。
第二部分:影像處理、分析與視覺系統;推薦技術;資料整合;優化方法;圖形應用;分析;安全/隱私;基準測試與調查。