Software Failure Investigation: A Near-Miss Analysis Approach

Jan Eloff, Madeleine Bihina Bella

  • 出版商: Springer
  • 出版日期: 2017-09-18
  • 售價: $5,357
  • 貴賓價: 9.5$5,089
  • 語言: 英文
  • 頁數: 119
  • 裝訂: Hardcover
  • ISBN: 3319613332
  • ISBN-13: 9783319613338

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商品描述

This book reviews existing operational software failure analysis techniques and proposes near-miss analysis as a novel, and new technique for investigating and preventing software failures. The authors provide details on how near-miss analysis techniques focus on the time-window before the software failure actually unfolds, so as to detect the high-risk conditions that can lead to a major failure. They detail how by alerting system users of an upcoming software failure, the detection of near misses provides an opportunity to collect at runtime failure-related data that is complete and relevant. They present a near-miss management systems (NMS) for detecting upcoming software failures, which can contribute significantly to the improvement of the accuracy of the software failure analysis. A prototype of the NMS is implemented and is discussed in the book. The authors give a practical hands-on approach towards doing software failure investigations by means of near-miss analysis that is of use to industry and academia