Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (Hardcover)
H. Bubert, H. Jenett
- 出版商: Wiley-VCH
- 出版日期: 2002-05-07
- 售價: $2,000
- 貴賓價: 9.8 折 $1,960
- 語言: 英文
- 頁數: 353
- 裝訂: Hardcover
- ISBN: 3527304584
- ISBN-13: 9783527304585
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商品描述
The development and quality assurance of such high-tech materials as
semiconductors or biopolymers demand special analytical methods for surfaces and
thin films. This book presents the whole spectrum of methods available in a
clear manner, moving beyond the basics, equipment and applications to compare
these methods. This allows users to find the optimum method in solving any given
problem.
- The book is richly illustrated with 200 figures
- Almost 900
references guide to the primary literature
- A list of suppliers, each with
full address, makes it easy to obtain the required equipment
Table of Contents
Preface.
List of Authors.
Introduction (J. Rivi鋨e & H. Bubert).
Electron Detection.
Photoelectron Spectroscopy.
Auger Electron Spectroscopy (AES) (H. Bubert & J. Rivi鋨e).
Electron Energy-Loss Spectroscopy (EELS) (R. Schneider).
Low-energy Electron Diffraction (LEED) (G. Held).
Other Electron-detecting Techniques (J. Rivi鋨e).
Ion Detection.
Static Secondary Ion Mass Spectrometry (SSIMS) (H. Arlinghaus).
Dynamic Secondary Ion Mass Spectrometry (SIMS) (H. Hutter).
Electron-impact (EI) Secondary Neutral Mass Spectrometry (SNMS) (H. Jenett).
Laser-SNMS (H. Arlinghaus).
Rutherford Back-scattering Spectroscopy (RBS) (L. Palmetshofer).
Low-energy Ion Scattering (LEIS) (P. Bauer).
Elastic Recoil Detection Analysis (ERDA) (O. Benka).
Nuclear Reaction Analysis (NRA) (O. Benka).
Other Ion-detecting Techniques (J. Rivi鋨e).
Photon Detection.
Total Reflection X-ray Fluorescence Analysis (TXRF) (L. Fabry & S. Pahlke).
Energy-dispersive X-ray Spectroscopy (EDXS) (R. Schneider).
Grazing Incidence X-ray Methods for Near-surface Structural Studies (P. Gibson).
Glow Discharge Optical Emission Spectroscopy (GD-OES) (A. Quentmeier).
Surface Analysis by Laser Ablation (M. Bolshov).
Ion Beam Spectrochemical Analysis (IBSCA) (V. Rupertus).
Reflection Absorption IR Spectroscopy (RAIRS) (K. Hinrichs).
Surface-enhanced Raman Scattering (SERS) (W. Hill).
UV-Vis-IR Ellipsometry (ELL) (B. Gruska & A. R飉eler).
Other Photon-detecting Techniques (J. Rivi鋨e).
Scanning Probe Microscopy.
Atomic Force Microscopy (AFM) (G. Friedbacher).
Scanning Tunneling Microscopy (STM) (G. Friedbacher).
Summary and Comparison of Techniques.
Surface and Thin Film Analytical Equipment Suppliers.
References.
Index.