EM Material Characterization Techniques for Metamaterials (SpringerBriefs in Electrical and Computer Engineering)
暫譯: 超材料的電磁材料特性表徵技術（電氣與計算機工程系列）

Raveendranath U. U. Nair

EM Material Characterization Techniques for Metamaterials (SpringerBriefs in Electrical and Computer Engineering)
  • 出版商: Springer
  • 出版日期: 2017-10-02
  • 售價: $2,160
  • 貴賓價: 9.5 折 $2,052
  • 語言: 英文
  • 頁數: 76
  • 裝訂: Paperback
  • ISBN: 9811065160
  • ISBN-13: 9789811065163

    • 海外代購書籍(需單獨結帳)

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商品描述

This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail.

Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects.

The book provides a valuable resource for researchers working in the field of metamaterials


 

商品描述(中文翻譯)

本書回顧了基於波導系統、帶狀線、自由空間系統等技術，詳細討論了每種方法的顯著特徵。

由於超材料通常是非均勻和各向異性的，因此對超材料結構進行電磁（EM）材料特性表徵的實驗技術需要面對幾個挑戰。此外，超材料結構所支持的模式對外部擾動極為敏感。因此，EM材料特性表徵的測量裝置必須進行修改，以考慮這些影響。

本書為從事超材料領域研究的研究人員提供了寶貴的資源。

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