VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science)

  • 出版商: Springer
  • 出版日期: 2018-01-26
  • 售價: $5,150
  • 貴賓價: 9.5$4,893
  • 語言: 英文
  • 頁數: 815
  • 裝訂: Paperback
  • ISBN: 9811074690
  • ISBN-13: 9789811074691

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商品描述

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.