VLSI Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 4-6, 2019, Revised Selected Papers

Sengupta, Anirban, Dasgupta, Sudeb, Singh, Virendra

  • 出版商: Springer
  • 出版日期: 2019-08-18
  • 售價: $4,760
  • 貴賓價: 9.5$4,522
  • 語言: 英文
  • 頁數: 775
  • 裝訂: Quality Paper - also called trade paper
  • ISBN: 9813297662
  • ISBN-13: 9789813297661
  • 相關分類: VLSI
  • 海外代購書籍(需單獨結帳)


This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.