Reliability Technology for Integrated Circuit Packaging
暫譯: 集成電路封裝的可靠性技術
Zhou, Bin, En, Yunfei, Chen, Si
- 出版商: Springer
- 出版日期: 2026-04-21
- 售價: $7,640
- 貴賓價: 9.5 折 $7,258
- 語言: 英文
- 頁數: 510
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 981953884X
- ISBN-13: 9789819538843
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相關分類:
微電子學 Microelectronics
海外代購書籍(需單獨結帳)
商品描述
This book consists of ten chapters on IC packaging technologies, covering failure modes, mechanisms, advanced structures and reliability methods, with a focus on materials, structure and stress. Reliability, a key indicator of product quality, spans multiple disciplines such as materials science and electronics. In China's pursuit of "high-quality development" a focus on reliability is essential to advancing manufacturing. Written by a leading expert from the State Key Laboratory, this book is important for improving the performance of electronic products and supporting the growth of China's electronic information industry.
商品描述(中文翻譯)
本書包含十個章節,探討集成電路(IC)封裝技術,涵蓋失效模式、機制、先進結構及可靠性方法,重點在於材料、結構和應力。可靠性是產品質量的一個關鍵指標,涉及多個學科,如材料科學和電子學。在中國追求「高品質發展」的過程中,專注於可靠性對於推進製造業至關重要。本書由國家重點實驗室的領先專家撰寫,對於提升電子產品的性能及支持中國電子信息產業的成長具有重要意義。