Basics of Interferometry, 2/e (Hardcover)
暫譯: 干涉測量基礎,第2版 (精裝本)
P. Hariharan
- 出版商: Academic Press
- 出版日期: 2006-11-01
- 售價: $3,870
- 貴賓價: 9.5 折 $3,677
- 語言: 英文
- 頁數: 248
- 裝訂: Hardcover
- ISBN: 0123735890
- ISBN-13: 9780123735898
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相關分類:
光學 Optics
海外代購書籍(需單獨結帳)
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商品描述
Optical interferometry is used in communications, medical imaging, astonomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface inspections of micromachined surfaces and semiconductors. Medical technicians are able to give more consise diagnoses with the employ of interferometers in microscopy, spectroscopy, and coherent tomography.
Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in their daily work lives. The need for interferometry knowledge has crossed the boundaries of engineering fields and Dr. Hariharan has written a book that answers the questions that new practitioners to interferometry have and haven't even thought of yet. This new edition includes complete updates of all material with an emphasis on applications. It also has new chapters on white-light microsopy and interference with single photons.
*Outstanding introduction to the world of optical interferometry with summaries at the begining and end of each chapter, several appendices with essential information, and worked numerical problems
*Practical details enrich understanding for readers new to this material
*New chapters on white-light microscopy for medical imaging and interference with single photons(quantum optics)
Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in their daily work lives. The need for interferometry knowledge has crossed the boundaries of engineering fields and Dr. Hariharan has written a book that answers the questions that new practitioners to interferometry have and haven't even thought of yet. This new edition includes complete updates of all material with an emphasis on applications. It also has new chapters on white-light microsopy and interference with single photons.
*Outstanding introduction to the world of optical interferometry with summaries at the begining and end of each chapter, several appendices with essential information, and worked numerical problems
*Practical details enrich understanding for readers new to this material
*New chapters on white-light microscopy for medical imaging and interference with single photons(quantum optics)
商品描述(中文翻譯)
光學干涉測量技術被應用於通訊、醫學影像、天文學和結構測量。透過干涉儀,工程師和科學家能夠對微機械表面和半導體進行表面檢查。醫療技術人員在顯微鏡學、光譜學和相干斷層掃描中使用干涉儀,能夠提供更精確的診斷。
這些材料源自於一個為期一天的課程,後來擴展為一個針對對光學知識了解不多但在日常工作中需要更多知識的工程師和科學家的入門介紹。對干涉測量知識的需求已跨越工程領域的界限,哈里哈蘭博士撰寫了一本書,回答了新進干涉測量從業者所提出的問題,以及那些他們尚未想到的問題。這個新版本包含了所有材料的完整更新,並強調應用。它還新增了關於白光顯微鏡和單光子干涉的新章節。
* 出色的光學干涉測量世界入門,並在每章的開始和結尾提供摘要,附有幾個包含重要資訊的附錄,以及已解決的數值問題
* 實用細節豐富了對於新接觸此材料的讀者的理解
* 新增關於醫學影像的白光顯微鏡和單光子干涉(量子光學)的章節
