Quantitative Atomic-Resolution Electron Microscopy, 217

Hÿtch, Martin, Hawkes, Peter W.

  • 出版商: Academic Press
  • 出版日期: 2021-04-07
  • 售價: $7,850
  • 貴賓價: 9.5$7,458
  • 語言: 英文
  • 頁數: 296
  • 裝訂: Hardcover - also called cloth, retail trade, or trade
  • ISBN: 0128246073
  • ISBN-13: 9780128246078
  • 海外代購書籍(需單獨結帳)

商品描述

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting, Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.