Basic ESD and I/O Design

Sanjay Dabral, Timothy Maloney

  • 出版商: Wiley
  • 出版日期: 1998-12-14
  • 售價: $1,500
  • 貴賓價: 9.8$1,470
  • 語言: 英文
  • 頁數: 328
  • 裝訂: Hardcover
  • ISBN: 0471253596
  • ISBN-13: 9780471253594
  • 無法訂購




The first comprehensive guide to ESD protection and I/O design

Basic ESD and I/O Design is the first book devoted to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much-needed reference for practicing engineers who are frequently called upon to learn the subject on the job.

This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve. Basic ESD and I/O Design:

  • Describes strategies for design-oriented ESD protection
  • Explains layout methods that enhance ESD protection designs
  • Addresses basic I/O designs, including new problems such as mixed voltage interfaces
  • Discusses fabrication aspects affecting ESD and I/O protection
  • Illustrates concepts using numerous figures and examples
  • Expresses device physics in terms of simple electrical circuit models
  • Cross-references the material to standard texts in the field

Essential for engineers in industry and anyone designing circuits, systems, or devices for future technologies, Basic ESD and I/O Design is also a useful reference for researchers and graduate students involved in core VLSI design or computer architecture.



Table of Contents:

ESD Protection Methodology.

Additional ESD Considerations.


Layout Issues.

ESD and I/O Interactions.

Mixed-Voltage ESD.

ESD Reliability Measurement and Failure Analysis Basics.