Integrated Circuit Manufacturability: The Art Of Process And Design Integration
Jose Pineda de Gyvez, IEEE Circuits and Systems Society, Dhiraj Pradhan
- 出版商: John Wiley
- 出版日期: 1998-10-30
- 售價: $7,215
- 貴賓價: 9.5 折 $6,854
- 語言: 英文
- 頁數: 332
- 裝訂: Hardcover
- ISBN: 0780334477
- ISBN-13: 9780780334472
Electrical Engineering Integrated Circuit Manufacturability The Art of Process and Design Integration Integrated Circuit Manufacturability provides comprehensive coverage of the process and design variables that determine the ease and feasibility of the fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. Integrated Circuit Manufacturability illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today’s design practices:
- Yield management strategies
- Effects of spot defects
- Inductive fault analysis and testing
- Fault-tolerant architectures and MCM testing strategies
This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing.
Table of Contents:
Introduction (José Pineda de Gyvez).
Defect Monitoring and Characterization (Eric Bruls).
Digital CMOS Fault Modeling and Inductive Fault Analysis (Manoj Sachdev).
Functional Yield Modeling (Gary C. Cheek and Geoff O'Donoghue).
Critical Area and Fault Probability Prediction (D.M.H. Walker).
Statistical Methods of Parametric Yield and Quality Enhancement (Maciej Styblinski).
Architectural Fault Tolerance (S.K. Tewksbury).
Design for Test and Manufacturability (Dhiraj Pradhan and Adit Singh).
Testing Solutions for MCM Manufacturing (Yervant Zorian).
About the Editors.