Essentials of Electronic Testing: for Digital, Memory & Mixed-Signal VLSI Circui (Hardcover)

M. Bushnell, Vishwani Agrawal

  • 出版商: Kluwer Academic Publ
  • 出版日期: 2000-11-30
  • 售價: $1,200
  • 貴賓價: 9.8$1,176
  • 語言: 英文
  • 頁數: 690
  • 裝訂: Hardcover
  • ISBN: 0792379918
  • ISBN-13: 9780792379911
  • 相關分類: VLSI使用者介面 UI
  • 立即出貨 (庫存=1)

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商品描述

Description:

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means `meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.
The book consists of:
  • Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling;
  • Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test;
  • Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing;
Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.

商品描述(中文翻譯)

描述:
今天的電子設計和測試工程師處理多種類型的子系統,包括數字、記憶體和混合信號,每種子系統都需要不同的測試和設計測試性方法。本書精選了這三種電路的重要主題。測試的結果是產品品質,這意味著“以最低成本滿足用戶需求”。本書還包括測試經濟學和確定VLSI晶片缺陷水平的技術。除了作為測試課程的教科書外,它還是一本對任何類型的電子設備、系統或片上系統進行測試的完整指南。

本書包括以下內容:
第一部分:介紹、測試流程和ATE、測試經濟學和產品品質、故障建模;
第二部分:邏輯和故障模擬、測試性度量、組合式ATPG、時序ATPG、記憶體測試、基於DSP的類比測試、基於模型的類比測試、延遲測試、IDDQ測試;
第三部分:DFT和掃描設計、BIST、邊界掃描、類比測試總線、系統測試和基於核心的設計、未來測試;
附錄:循環冗餘檢查碼理論、原始多項式、測試書籍;參考文獻:超過700條目。