Essentials of Electronic Testing: for Digital, Memory & Mixed-Signal VLSI Circui (Hardcover)
暫譯: 電子測試基礎：數位、記憶體與混合信號 VLSI 電路

Description:

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means `meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.
The book consists of:

• Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling;
• Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test;
• Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing;

Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.