Atomic Force Microscopy for Energy Research

Shen, Cai

  • 出版商: CRC
  • 出版日期: 2022-05-06
  • 售價: $8,570
  • 貴賓價: 9.5$8,142
  • 語言: 英文
  • 頁數: 441
  • 裝訂: Hardcover - also called cloth, retail trade, or trade
  • ISBN: 103200407X
  • ISBN-13: 9781032004075
  • 海外代購書籍(需單獨結帳)


Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials--such as lithium-ion batteries, solar cells, and other energy-related materials--are addressed.


  • First book to focus on application of AFM for energy research
  • Details the use of advanced AFM and addresses many types of functional AFM tools
  • Enables readers to operate an AFM instrument successfully and to understand the data obtained
  • Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy

With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.


Cai Shen received his Ph.D. in Chemistry from the University of St Andrews at UK in 2008. Sequentially, he continued his research at the University of Maryland, Heidelberg University and Aarhus University before he joined Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Science as an Associate Professor in 2013. He was promoted to Professor in 2021. He has published 100 papers in peer-reviewed journals. He is on the editorial boards for a number of international journals including Journal of Microscopy. His current research interests are lithium-ion batteries and applications of atomic force microscopy for the study of functional materials.