Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices (Hardcover)

Peter W. Epperlein

  • 出版商: Wiley
  • 出版日期: 2013-03-18
  • 定價: $4,880
  • 售價: 9.5$4,636
  • 語言: 英文
  • 頁數: 522
  • 裝訂: Hardcover
  • ISBN: 1119990335
  • ISBN-13: 9781119990338
  • 相關分類: 半導體
  • 立即出貨 (庫存=1)

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商品描述

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.

Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities.

Further key features include:

  • practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues;
  • detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application;
  • systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers;
  • coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program.

Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. 

 

Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany.

Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers.
 

Book Reviews

“Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices”. By Peter W. Epperlein

Prof. em. Dr. Heinz Jäckel, High Speed Electronics and Photonics, Swiss Federal Institute of Technology ETH Zürich, Switzerland

The book “Semiconductor Laser Engineering, Reliability and Diagnostics” by Dr. P.W. Epperlein is a landmark in the recent literature on semiconductor lasers because it fills a longstanding gap between many excellent books on laser theory and the complex and challenging endeavor to fabricate these devices reproducibly and reliably in an industrial, real world environment.

Having worked myself in the early research and development of high power semiconductor lasers, I appreciate the competent, complete and skillful presentation of these three highly interrelated topics, where small effects have dramatic consequences on the success of a final product, on the ultimate performance and on the stringent reliability requirements, which are the name of the game.

As the title suggests the author addresses three tightly interwoven and critical topics of state-of-the-art power laser research. The three parts are: device and mode stability engineering (chapter 1, 2), reliability mechanisms and reliability assessment strategies (chapter 3, 4, 5, 6) and finally material and device diagnostics (chapter 7, 8, 9) all treated with a strong focus on the implementation. This emphasis on the complex practical aspects for a large-scale power laser fabrication is a true highlight of the book.

The subtle interplay between laser design, reliability strategies, advanced failure analysis and characterization techniques are elaborated in a very rigorous and scientific way using a very clear and easy to read representation of the complex interrelation of the three major topics. I will abstain from trying to provide a complete account of all the topics but mainly concentrate on the numerous highlights.

The first part 1 “Laser Engineering” is divided in two chapters on basic electronic-optical, structural, material and resonator laser engineering on the one side, and on single mode control and stability at very high, still reliable power-levels with the trade-off between mirror damage, single mode stability on the other side. To round up the picture less well-known concepts and the state-of-the-art of large-area lasers, which can be forced into single-mode operation, are reviewed carefully. The subtle and complex interplay, which is challenging to optimize for a design for reliability and low stress as a major boundary condition is crucial for the design. The section gives a rather complete and well-referenced account of all relevant aspects, relations and trade-offs for understanding the rest of the book.

The completeness of the presentation on power laser diode design based on basic physical and plausible arguments is mainly based on analytic mathematical relations as well as experiments providing a new and well-balanced addition for the power diode laser literature in particular. Modern 2D self-consistent electro-optical laser modeling including carrier hole burning and thermal effects – this is important because the weak optical guiding and gain-discrimination depend critically on rather small quantities and effects, which are difficult to optimize experimentally – is used in the book for simulation results, but is not treated separately.

The novel and really original, “gap-filling” bulk of the book is elaborated by the author in a very clear way in the following four chapters in the part 2 “Laser Reliability” on laser degradation physics and mirror design and passivation at high power, followed then by two very application oriented chapters on reliability design engineering and practical reliability strategies and implementation procedures. This original combination of integral design and reliability aspects – which are mostly neglected  in standard literature – is certainly a major plus of this book. I liked this second section as a whole, because it provides excellent insights in degradation physics on a high level and combines it in an interesting and skillful way with the less “glamorous” (unfortunately) but highly relevant reliability science and testing strategies, which is particularly important for devices operating at extreme optical stresses with challenging lifetime requirements in a real word environment.

Finally, the last part 3 “Laser Diagnostics” comprising three chapters, is devoted mainly to advanced experimental diagnostics techniques for material integrity, mechanical stress, deep level defects, various dynamic laser degradation effects, surface- and interface quality, and most importantly heating and disordering of mirrors and mirror coatings. The topics of characterization techniques comprising micro-Raman- and micro-thermoreflectance-probing, 2K photoluminescence spectroscopy, micro-electroluminescence and photoluminescence scanning, and deep-level-transient spectroscopy have been pioneered by the author for the specific applications over many years guaranteeing many competent and well represented insights. These techniques are brilliantly discussed and the information distributed in many articles by the author has been successfully unified in a book form.

In my personal judgment and liking, I consider the parts 2 and 3 on reliability and diagnostics as the most valuable and true novel contribution of the book, which in combination with the extremely well-covered laser design of part 1 clearly fill the gap in the current diode laser literature, which in this detail has certainly been neglected in the past.

In summary, I can highly recommend this excellent, well-organized and clearly written book to readers who are already familiar with basic diode laser theory and who are active in the academic and industrial fabrication and characterization of semiconductor lasers. Due to its completeness, it also serves as an excellent reference of the current state-of-the-art in reliability engineering and devi...

商品描述(中文翻譯)

這本參考書提供了一種全面整合的新方法,以開發高功率、單橫模、邊射型二極體雷射,同時在同一本書中討論了設備工程、可靠性工程和設備診斷等相關主題,從而彌補了當前書籍文獻中的空白。

首先討論了二極體雷射的基礎知識,接著詳細討論了問題導向的設計準則和技術,以及對雷射退化原因的系統性探討,並深入探索了提高雷射光學強度的工程手段。在可靠性工程方法和模型的背景下,討論了關鍵雷射特性的穩定性標準和關鍵雷射強度因素,以及明確的設計考慮因素,以及可靠性測試和雷射產品資格認證的典型方案。首次在書籍文獻中詳細回顧了新穎的先進診斷方法,討論了溫度、應力和材料不穩定等對性能和可靠性的影響因素。

進一步的關鍵特點包括:
- 考慮可靠性相關效應、關鍵雷射強度因素、基本雷射製造和封裝問題的實用設計準則;
- 詳細討論二極體雷射的診斷研究,應用方法和技術的基礎,其中許多是作者首創的,適用於特定目的並在應用中具有創新性;
- 系統性地了解雷射退化模式,如災難性光損傷,以及提高二極體雷射光學強度的各種技術;
- 詳細介紹雷射可靠性工程的基本概念和技術,包括標準商業高功率雷射可靠性測試計劃的細節。

《半導體雷射工程、可靠性和診斷》反映了作者在二極體雷射領域的廣泛專業知識,既是頂尖科學研究人員,也是高功率高可靠性設備的關鍵開發者。這本新的參考書提供了寶貴的實用建議,適合從事二極體雷射技術研究的實踐研究人員和研究生閱讀。

彼得·W·埃佩蓮博士是英國自己的半導體技術咨詢業務Pwe-PhotonicsElectronics-IssueResolution的技術顧問。他在光子學和電子學領域擁有三十年的職業生涯,專注於新興技術,曾在全球和初創公司,包括IBM、惠普、安捷倫科技、飛利浦/NXP、Essient Photonics和IBM/JDSU Laser Enterprise等公司工作。他擁有德國斯圖加特大學的物理學學士、碩士和博士學位,並以優異成績獲得博士學位。

埃佩蓮博士是化合物半導體和二極體雷射技術的國際知名專家。他在許多設備領域進行了研發工作,如半導體雷射、LED、光學調制器、量子井器件、諧振穿隧器件、場效應管和超導穿隧接點和集成電路。他在複雜診斷研究方面的開創性工作,已經發表了許多世界首次報告,並被其他學術界和工業界的研究人員所採用。他發表了七十多篇同行評審的期刊論文,在IBM技術披露公告中發表了十多個發明申報,並擔任了許多技術期刊的審稿人,並獲得了五項IBM研究部門獎項。他的主要成就包括設計和製造高功率、高可靠性、單模二極體雷射。

書評:
《半導體雷射工程、可靠性和診斷》