Surface Analysis: The Principal Techniques
暫譯: 表面分析:主要技術
Vickerman, John C., Gilmore, Ian S.
- 出版商: Wiley
- 出版日期: 2026-09-22
- 售價: $5,200
- 貴賓價: 9.5 折 $4,940
- 語言: 英文
- 頁數: 576
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 1394244541
- ISBN-13: 9781394244546
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相關分類:
材料科學 Meterials
尚未上市,無法訂購
商品描述
Understand the principles and applications of surface analysis
Analyzing the composition of a given surface is a crucial aspect of materials science, with significant bearing on the way a material will interact with a particular environment. Surface analysis draws upon a substantial body of research to analyze the outer few nanometres of a material, and has considerable significance in laboratories studying corrosion, adhesion, polymer surface treatment and more.
Surface Analysis offers a comprehensive and accessible overview of the characterization and analysis of outer substrate layers. It brings together experts in each analysis area to lay out foundational theory, offer practical applications, and provide examples. Now fully up to date and reflecting the latest research, it is a must-own for any scientist incorporating surface analysis into laboratory work.
Readers of the third edition of Surface Analysis readers will also find:
- Two new chapters on advanced mass spectrometry methods
- Detailed coverage of ever-more-important methods of data analysis
- Tools for concretely improving laboratory and research outcomes
Surface Analysis is ideal for practitioners and advanced graduate students in materials science, solid state physics, optics, and chemistry.
商品描述(中文翻譯)
了解表面分析的原理與應用
分析特定表面的組成,是材料科學中至關重要的一環,並會大幅影響材料與特定環境互動的方式。表面分析運用大量研究成果,分析材料最外層數個奈米的區域,對於研究腐蝕、附著、聚合物表面處理等主題的實驗室而言,具有相當重要的意義。
《Surface Analysis》全面且易於理解地介紹外部基材層的特性鑑定與分析。本書邀集各分析領域的專家,說明基礎理論、提供實務應用,並介紹相關範例。本版內容已全面更新,納入最新研究成果,是任何將表面分析應用於實驗室工作的科學家不可或缺的參考書。
《Surface Analysis》第三版讀者還將學到:
• 新增兩章,介紹進階質譜分析方法
• 詳細說明日益重要的資料分析方法
• 協助具體改善實驗室與研究成果的工具
《Surface Analysis》非常適合材料科學、固態物理學、光學與化學領域的實務工作者及高年級研究生閱讀。
作者簡介
JOHN C. VICKERMAN, PhD, DSc, FRSC, is Professor Emeritus at the University of Manchester. He got his PhD in Surface Chemistry at the University of Bristol and held postdoctoral fellowships at the University of Bristol, the Technical University of Eindhoven, and sabbatical Alexander von Humboldt Fellowships at the Universities of Munich and Berlin. He is known as a pioneer and international leader in the development of surface analysis by secondary ion mass spectrometry (SIMS), in recognition of which he received the Theophilus Redwood Award from the Royal Society of Chemistry and the Médaille Chevenard medal of the Société Française de Métallurgie et de Matériaux.
IAN S. GILMORE, PhD, FMedSci, is a Senior Fellow at the National Physical Laboratory in Teddington, UK and visiting Professor at the University of Nottingham. He is known for breakthroughs in high-resolution molecular imaging by mass spectrometry. More recently. he innovated a quantum detector boosting the sensitivity of high-resolution mass spectrometers by an order of magnitude. He was elected a Fellow of the Academy of Medical Sciences in 2023 and is the recipient of the Medard W. Welch Award from the American Vacuum Society.
作者簡介(中文翻譯)
JOHN C. VICKERMAN, PhD, DSc, FRSC,為 University of Manchester 榮譽退休教授。他在 University of Bristol 取得表面化學博士學位,並曾於 University of Bristol、Eindhoven University of Technology 擔任博士後研究員,亦曾以 Alexander von Humboldt Fellowships 資格,前往 University of Munich 與 University of Berlin 進行休假研究。他被譽為以二次離子質譜法(secondary ion mass spectrometry, SIMS)發展表面分析技術的先驅及國際領導者。為表彰其貢獻,他曾獲 Royal Society of Chemistry 頒發 Theophilus Redwood Award,以及 Société Française de Métallurgie et de Matériaux 頒發 Médaille Chevenard 獎章。
IAN S. GILMORE, PhD, FMedSci,為英國 Teddington 國家物理實驗室(National Physical Laboratory)的資深研究員,也是 University of Nottingham 的客座教授。他以透過質譜法進行高解析度分子成像方面的突破性成果而聞名。近年來,他創新研發出一種量子偵測器,使高解析度質譜儀的靈敏度提升一個數量級。他於 2023 年獲選為 Academy of Medical Sciences 院士,並獲得 American Vacuum Society 頒發的 Medard W. Welch Award。