CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

Andrei Pavlov, Manoj Sachdev

  • 出版商: Springer
  • 出版日期: 2008-06-23
  • 售價: $7,070
  • 貴賓價: 9.5$6,717
  • 語言: 英文
  • 頁數: 194
  • 裝訂: Hardcover
  • ISBN: 1402083629
  • ISBN-13: 9781402083624

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商品描述

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.