Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
暫譯: 納米尺度電路與系統的可靠性:方法論與電路架構

Miloš Stanisavljević, Alexandre Schmid, Yusuf Leblebici

  • 出版商: Springer
  • 出版日期: 2010-10-21
  • 售價: $3,970
  • 貴賓價: 9.5$3,772
  • 語言: 英文
  • 頁數: 195
  • 裝訂: Hardcover
  • ISBN: 1441962166
  • ISBN-13: 9781441962164
  • 海外代購書籍(需單獨結帳)

商品描述

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

商品描述(中文翻譯)

本書旨在提供可靠性、故障、故障模型、奈米技術、奈米裝置、容錯架構及可靠性評估技術的概述。此外,本書還深入探討了容錯的最新研究成果和方法,以及從高度不可靠的元件設計容錯系統的方法論。