Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
暫譯: 納米尺度電路與系統的可靠性：方法論與電路架構

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.