Information Retrieval Models: Foundations and Relationships (Paperback)

Thomas Roelleke

  • 出版商: Morgan & Claypool
  • 出版日期: 2013-07-01
  • 售價: $1,400
  • 貴賓價: 9.5$1,330
  • 語言: 英文
  • 頁數: 164
  • 裝訂: Paperback
  • ISBN: 1627050787
  • ISBN-13: 9781627050784
  • 立即出貨 (庫存=1)


Information Retrieval (IR) models are a core component of IR research and IR systems. The past decade brought a consolidation of the family of IR models, which by 2000 consisted of relatively isolated views on TF-IDF (Term-Frequency times Inverse-Document-Frequency) as the weighting scheme in the vector-space model (VSM), the probabilistic relevance framework (PRF), the binary independence retrieval (BIR) model, BM25 (Best-Match Version 25, the main instantiation of the PRF/BIR), and language modelling (LM). Also, the early 2000s saw the arrival of divergence from randomness (DFR).

Regarding intuition and simplicity, though LM is clear from a probabilistic point of view, several people stated: "It is easy to understand TF-IDF and BM25. For LM, however, we understand the math, but we do not fully understand why it works."

This book takes a horizontal approach gathering the foundations of TF-IDF, PRF, BIR, Poisson, BM25, LM, probabilistic inference networks (PIN's), and divergence-based models. The aim is to create a consolidated and balanced view on the main models.

A particular focus of this book is on the "relationships between models." This includes an overview over the main frameworks (PRF, logical IR, VSM, generalized VSM) and a pairing of TF-IDF with other models. It becomes evident that TF-IDF and LM measure the same, namely the dependence (overlap) between document and query. The Poisson probability helps to establish probabilistic, non-heuristic roots for TF-IDF, and the Poisson parameter, average term frequency, is a binding link between several retrieval models and model parameters.

Table of Contents: List of Figures / Preface / Acknowledgments / Introduction / Foundations of IR Models / Relationships Between IR Models / Summary & Research Outlook / Bibliography / Author's Biography / Index