Mass Metrology: The Newly Defined Kilogram
暫譯: 質量計量學：新定義的千克

Gupta, S. V.

Mass Metrology: The Newly Defined Kilogram
  • 出版商: Springer
  • 出版日期: 2019-04-02
  • 售價: $6,820
  • 貴賓價: 9.5 折 $6,479
  • 語言: 英文
  • 頁數: 453
  • 裝訂: Hardcover - also called cloth, retail trade, or trade
  • ISBN: 3030124649
  • ISBN-13: 9783030124649

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商品描述

This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck's constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro's number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity.

Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck's constant.

商品描述(中文翻譯)

這本《質量計量學：新定義的公斤》的第二版已全面修訂，以反映最近根據普朗克常數重新定義公斤的情況。在第一版中，已經強調了根據物理常數定義公斤的必要性。然而，公斤也可以根據阿伏伽德羅數來定義，使用重元素的離子集合，通過懸浮法，或使用電壓和瓦特平衡來實現。本書還探討了重力質量、慣性質量和常規質量的概念，並詳細描述了重力加速度的變化。

第二版中涵蓋的進一步主題包括：重力變化對電子天平讀數的影響，這些讀數是根據緯度、高度和地球地形推導的；根據國際法定計量局（OIML）對重量的分類；以及各類重量的最大允許誤差，這些誤差由國家和國際組織規定。本書還討論了群體稱重技術以及使用納米技術檢測小至10^-24克的質量差異。最後但同樣重要的是，讀者將找到有關XRCD方法的詳細信息，該方法是根據普朗克常數定義公斤的。

作者簡介

Dr. S.V. Gupta holds Master's degrees in Physics from Allahabad University and in Mathematics from Agra University. He obtained his Ph.D. in the area of diffrimoscopic imaging at Delhi University. Dr. Gupta subsequently completed advanced training at the International Bureau of Weights and Measures, BIPM, France; International Organisation of Legal Metrology, OIML, Paris France; National Physical Laboratory, UK; and PTB (Physikalisch-Technische Bundesanstalt), Germany. He has been involved in various projects with the National Institute for Standards and Technology, NIST, USA and with the PTB, Germany. Dr. Gupta was recently awarded the title of "Mapiki Ratan" (a Jewel in Metrology). Further international awards include Membership in The Institute of Physics, UK, and the Honours and Awards List of the OIML since 2004.

作者簡介(中文翻譯)

Dr. S.V. Gupta 擁有來自阿拉哈巴德大學的物理碩士學位和來自阿格拉大學的數學碩士學位。他在德里大學獲得了有關衍射顯微成像的博士學位。隨後，Gupta 博士在法國國際計量局 (BIPM)、法國巴黎的國際法定計量組織 (OIML)、英國國家物理實驗室 (NPL) 和德國物理技術聯邦研究所 (PTB) 完成了進階訓練。他參與了美國國家標準與技術研究所 (NIST) 和德國 PTB 的各種項目。最近，Gupta 博士被授予「Mapiki Ratan」的稱號（計量學中的瑰寶）。其他國際獎項包括英國物理學會會員資格，以及自 2004 年以來的 OIML 榮譽與獎項名單。

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