Recent Advances in Microelectronics Reliability: Contributions from the European Ecsel Ju Project Irel40
暫譯: 微電子可靠性最新進展：來自歐洲Ecsel Ju計畫Irel40的貢獻
Van Driel, Willem Dirk, Pressel, Klaus, Soyturk, Mujdat
相關主題
商品描述
This book describes the latest progress in reliability analysis of microelectronic products. The content grows out of an EU project, named Intelligent Reliability 4.0 - iRel40 (see www.irel40.eu ). Different industrial sectors and topics are covered, such as electronics in automotive, rail transport, lighting and personal appliances. Several case studies and examples are discussed, which will enable readers to assess and mitigate similar failure cases. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices.
- Describes state-of-the-art methodologies for analyzing the reliability, failure, and degradation of electronic devices;
- Discusses how to correlate electronic processing and performance to reliability and lifetime;
- Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of electronic devices.
商品描述(中文翻譯)
本書描述了微電子產品可靠性分析的最新進展。內容源自一個歐盟項目，名為智能可靠性 4.0 - iRel40（詳情請見 www.irel40.eu）。涵蓋了不同的工業領域和主題，例如汽車、鐵路運輸、照明和個人電器中的電子產品。書中討論了幾個案例研究和範例，這將使讀者能夠評估和減輕類似的故障案例。更重要的是，本書試圖呈現分析故障的方法論和有用的途徑，並將故障與電子設備的可靠性相關聯。
- 描述了分析電子設備的可靠性、故障和劣化的最先進方法論；
- 討論了如何將電子處理和性能與可靠性和壽命相關聯；
- 提供了預測電子設備壽命和可靠性的模擬技術和方法論的概述。
