Introduction to Microelectronics Advanced Packaging Assurance
暫譯: 微電子先進封裝保證導論
Asadizanjani, Navid, Reddy Kottur, Himanandhan, Dalir, Hamed
- 出版商: Springer
- 出版日期: 2025-04-23
- 售價: $2,380
- 貴賓價: 9.5 折 $2,261
- 語言: 英文
- 頁數: 183
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 3031861019
- ISBN-13: 9783031861017
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相關分類:
微電子學 Microelectronics
海外代購書籍(需單獨結帳)
商品描述
This book offers a comprehensive introduction and in-depth information on all the packaging technologies and fabrication methodologies employed in advanced semiconductor packaging. Coverage includes materials, substrates, and assembly processes, as well as critical areas of testing and reliability, which are crucial for ensuring the utmost quality and reliability of advanced packaging solutions.
商品描述(中文翻譯)
本書提供了對於先進半導體封裝中所使用的所有封裝技術和製造方法的全面介紹和深入資訊。內容涵蓋材料、基板和組裝過程,以及測試和可靠性等關鍵領域,這些對於確保先進封裝解決方案的最高品質和可靠性至關重要。
作者簡介
Navid Asadizanjani is an associate Professor in the Electrical and Computer Engineering Department at the University of Florida, with affiliation in the Materials Science and Engineering Department. He holds a Ph.D. in Mechanical Engineering and has dedicated his career to advancing research in physical inspection, advanced packaging assurance, non-destructive imaging, multi-modal image analysis, metrology, system- and chip-level decomposition, and counterfeit detection. Dr. Asadizanjani serves as the director of the Security and Assurance (SCAN) Lab, which houses over $12 million in advanced imaging and characterization equipment. He is also the deputy director for research and development within the Florida Semiconductor Institute (FSI). His contributions have been recognized through numerous prestigious awards, including the NSF CAREER Award (2022), multiple best paper awards from IEEE PAINE, ISTFA, ASME ISFA, and the D.E. Crow Innovation Award. Dr. Asadizanjani is the founder and general chair of the IEEE Physical Assurance and Inspection of Electronics (PAINE) Conference. He holds over 20 patents, has authored three books, and has published more than 250 peer-reviewed articles in top-tier conferences and journals. His research projects are funded by various government agencies and industry leaders, including NSF, NIST, AFRL, AFOSR, ONR, the Army, SRC, Meta, Cisco, and Analog Devices.
Himanandhan Reddy Kottur is a senior PhD student in Electrical and Computer Engineering at the University of Florida (UF), USA. He received his B.S. in Electrical Engineering from Anna University, Chennai, India, and his M.S. in Electrical and Computer Engineering from UF in 2021 and 2023, respectively. Before starting his PhD, he spent a year volunteering at UF, where he researched MEMS energy harvesting using PZT materials to power low-power wireless sensors. His current research focuses on hardware security and counterfeit detection, with an emphasis on utilizing NEMS-based technologies to enhance the security of printed circuit boards (PCBs) and advanced semiconductor packages.Hamed Dalir is an associate professor in the department of electrical and computer engineering at university of Florida specializes in quantum AI, Semiconductor Laser, and high-speed photonics computing. Dr. Dalir has received numerous accolades for his contributions to the field, including the prestigious Yoshida Foundation Award for the Development of Future Leaders for Changing Times and the JSPS "Young Scientist Fellowship" in 2011 and 2014, respectively. Dr. Dalir's research has been supported by a range of organizations, including AFWERX, AFOSR, NASA, Army, AFRL, NIST, ONR, BAH, Broadcom, and private investors. He has published over sixty scholarly articles in high-impact journals such as Nature Communications, Biosensors and Bioelectronics, Optica, Laser Photonics Review, and Applied Physics Review. In addition, Dr. Dalir has delivered over a hundred keynote addresses, invited talks, and topic lectures at universities and international conferences.
作者簡介(中文翻譯)
Navid Asadizanjani 是佛羅里達大學電機與計算機工程系的副教授,並在材料科學與工程系有隸屬關係。他擁有機械工程博士學位,並致力於推進物理檢查、先進封裝保證、非破壞性成像、多模態影像分析、計量學、系統及晶片級分解以及偽造檢測等研究。Asadizanjani 博士擔任安全與保證(SCAN)實驗室的主任,該實驗室擁有超過1200萬美元的先進成像和表徵設備。他也是佛羅里達半導體研究所(FSI)研究與開發的副主任。他的貢獻獲得了多項著名獎項的認可,包括2022年的 NSF CAREER 獎、IEEE PAINE、ISTFA、ASME ISFA 的多個最佳論文獎,以及 D.E. Crow 創新獎。Asadizanjani 博士是 IEEE 電子物理保證與檢查會議(PAINE)的創始人和總主席。他擁有超過20項專利,撰寫了三本書籍,並在頂尖會議和期刊上發表了超過250篇經過同行評審的文章。他的研究項目獲得了包括 NSF、NIST、AFRL、AFOSR、ONR、陸軍、SRC、Meta、Cisco 和 Analog Devices 等各種政府機構和行業領導者的資助。
Himanandhan Reddy Kottur 是佛羅里達大學(UF)電機與計算機工程的高年級博士生。他在印度金奈的安娜大學獲得電機工程學士學位,並於2021年和2023年分別在UF獲得電機與計算機工程碩士學位。在開始攻讀博士學位之前,他在UF志願服務了一年,研究使用 PZT 材料進行 MEMS 能量收集,以為低功耗無線傳感器供電。
他目前的研究專注於硬體安全和偽造檢測,強調利用 NEMS 基礎技術來增強印刷電路板(PCBs)和先進半導體封裝的安全性。
Hamed Dalir 是佛羅里達大學電機與計算機工程系的副教授,專注於量子人工智慧、半導體激光和高速光子計算。Dalir 博士因其對該領域的貢獻而獲得多項榮譽,包括未來領導者發展的著名 Yoshida 基金會獎和2011年及2014年的 JSPS「青年科學家獎學金」。Dalir 博士的研究得到了包括 AFWERX、AFOSR、NASA、陸軍、AFRL、NIST、ONR、BAH、Broadcom 和私人投資者等多個組織的支持。他在《Nature Communications》、《Biosensors and Bioelectronics》、《Optica》、《Laser Photonics Review》和《Applied Physics Review》等高影響力期刊上發表了超過六十篇學術文章。此外,Dalir 博士在大學和國際會議上發表了超過一百場主題演講、受邀演講和專題講座。