Fundamentals of Powder Diffraction and Structural Characterization of Materials
暫譯: 粉末繞射與材料結構表徵基礎
Zavalij, Peter, Pecharsky, Vitalij K.
- 出版商: Springer
- 出版日期: 2026-09-28
- 售價: $3,590
- 貴賓價: 9.5 折 $3,410
- 語言: 英文
- 頁數: 802
- 裝訂: Quality Paper - also called trade paper
- ISBN: 3031915062
- ISBN-13: 9783031915062
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相關分類:
材料科學 Meterials、物理學 Physics、化學 Chemistry
海外代購書籍(需單獨結帳)
相關主題
商品描述
This expanded, updated, third edition features many new color illustrations, timely practical examples, and experimental and computational tools introduced in the past ten years, while retaining its excellent introduction to structural characterization and crystallography. The book is written for those interested in a fundamental conceptual understanding powder diffraction and structural characterization of materials as well as in practical skills in examining phase composition and structure of materials using modern experimental powder diffraction tools. Special attention is given to proper collection of powder diffraction data using laboratory x-ray, synchrotron, and neutron radiation. Exemplary data sets serve as a springboard for readers to develop knowledge about modern approaches, algorithms, and software, as well as to gain proficiency in extracting precise structural information about crystalline materials from powder diffraction data. The book requires nospecialized knowledge, so it is useful to beginners. Suitable for upper level undergraduate, and graduate students, as well as practitioners in the research labs and the field, the authors' in-depth treatment helps readers from various disciplines, including crystallography, materials science, solid state chemistry and physics, geology and mineralogy, become experts on this subject.
- Adds several new sections presenting symmetry of the magnetic structures and examples of structure solution and refinement;
- Introduces fundamentals of the crystal structure of matter in a concise yet rigorous style;
- Provides sufficient background on matter-radiation interactions.
商品描述(中文翻譯)
本書擴充並更新至第三版,新增許多彩色插圖、切合時宜的實務範例,以及過去十年間推出的實驗與計算工具,同時保留其對結構鑑定與晶體學的優良介紹。本書適合希望從基本概念理解粉末繞射與材料結構鑑定的人士,也適合希望培養實務技能、運用現代實驗粉末繞射工具檢驗材料相組成與結構的讀者。書中特別重視使用實驗室 X-ray、同步輻射與中子輻射正確收集粉末繞射資料。書中提供的示範資料集,可作為讀者學習現代方法、演算法與軟體的起點,並協助讀者熟練地從粉末繞射資料中擷取結晶材料的精確結構資訊。本書不要求讀者具備專門知識,因此也適合初學者。無論是高年級大學生、研究生,或研究實驗室與業界的實務工作者,都能從作者深入的內容中獲益。對於晶體學、材料科學、固態化學與物理、地質學及礦物學等不同領域的讀者而言,本書有助於成為此主題的專家。
• 新增數個章節,介紹磁性結構的對稱性,以及結構解析與精修的範例;
• 以精簡而嚴謹的方式介紹物質晶體結構的基礎;
• 提供充分的物質—輻射交互作用背景知識。
作者簡介
Peter Y. Zavalij is Director of the X-ray Crystallographic Center, Department of Chemistry and Biochemistry, University of Maryland at College Park, MD. Vitalij K. Pecharsky is Anson Marston Distinguished Professor in the Department of Materials Science and Engineering, and Ames Laboratory of the U.S. Department of Energy, Iowa State University, Ames, IA.
作者簡介(中文翻譯)
Peter Y. Zavalij 是 University of Maryland at College Park(馬里蘭大學學院市分校)化學與生物化學系 X-ray Crystallographic Center(X 射線晶體學中心)主任。Vitalij K. Pecharsky 是 Iowa State University(愛荷華州立大學)材料科學與工程系,以及 U.S. Department of Energy 的 Ames Laboratory(美國能源部 Ames 實驗室)的 Anson Marston Distinguished Professor(Anson Marston 特聘教授)。