Stability of IGZO-based Thin-Film Transistor

Hoshino, Ken, Wager, John

Stability of IGZO-based Thin-Film Transistor
  • 出版商: LAP Lambert Academic Publishing
  • 出版日期: 2010-09-07
  • 售價: $2,460
  • 貴賓價: 9.5 折 $2,337
  • 語言: 英文
  • 頁數: 152
  • 裝訂: Quality Paper - also called trade paper
  • ISBN: 3838399633
  • ISBN-13: 9783838399638
  • 相關分類: 電路學 Electric-circuits

    • 海外代購書籍(需單獨結帳)

商品描述

Amorphous oxide semiconductors (AOSs) are of great current interest for thin-film transistor (TFT) channel layer applications. In particular, indium gallium zinc oxide (IGZO) is under intense development for commercial applications because of its demonstrated high performance at low processing temperatures. The objective of the research presented in this book is to provide detailed assessments of device stability, temperature dependence, and related phenomena for IGZO- based TFTs processed at temperatures between 200 C and 300 C.

類似商品

最後瀏覽商品 (18)