CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test

Pavlov, Andrei, Sachdev, Manoj

CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
  • 出版商: Springer
  • 出版日期: 2010-10-28
  • 售價: $7,130
  • 貴賓價: 9.5 折 $6,774
  • 語言: 英文
  • 頁數: 194
  • 裝訂: Quality Paper - also called trade paper
  • ISBN: 904817855X
  • ISBN-13: 9789048178551
  • 相關分類: CMOS

    • 海外代購書籍(需單獨結帳)

商品描述

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

作者簡介

Prof. Sachdev has authored several successful books with Springer

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