Atomic Force Microscopy: A Concise Introduction
暫譯: 原子力顯微鏡：簡明介紹

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.

Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.

• Part I - AFM Instrumentation: Explains the working principles, components, and imaging modes of atomic force microscopy, enabling readers to confidently obtain high-quality topographic images from any AFM system.
• Part II - Force-Curve Acquisition and Interpretation: Guides readers through force spectroscopy, demonstrating how force-distance curves are acquired and interpreted while connecting the results to underlying physical and materials science principles.
• Advanced Chapter - Dynamic AFM Techniques: Introduces dynamic and resonance-based AFM, using complex numbers and differential equations to explain advanced imaging and measurement methods.