Digital Systems Testing and Testable Design (Hardcover)

Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman

  • 出版商: IEEE
  • 出版日期: 1994-09-27
  • 售價: $1,900
  • 貴賓價: 9.8$1,862
  • 語言: 英文
  • 頁數: 653
  • 裝訂: Hardcover
  • ISBN: 0780310624
  • ISBN-13: 9780780310629
  • 相關分類: 數位影像處理 Digital-image軟體工程
  • 無法訂購

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商品描述

Description:

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

 

Table of Contents:

Preface.

How This Book Was Written.

Introduction.

Modeling.

Logic Simulation.

Fault Modeling.

Fault Simulation.

Testing For Single Stuck Faults.

Testing For Bridging Faults.

Functional Testing.

Design For Testability.

Compression Techniques.

Built-In Self-Test.

Logic-Level Diagnosis.

Self-Checking Design.

PLA Testing.

System-Level Diagnosis.

Index.

商品描述(中文翻譯)

描述:
這本數位系統測試和可測設計的領先教材和參考書的最新版本提供了全面且最新的領域覆蓋。書中包含了廣泛的測試生成、經典和新技術的故障建模、模擬、故障模擬、可測性設計、內建自測和診斷等討論。這本書附有大量問題,是測試工程師、ASIC和系統設計師以及CAD開發人員必備的工具,高級工程學生將發現這本書是一個寶貴的工具,以保持與領域中最新變化的接軌。

目錄:
前言。
本書的撰寫方式。
引言。
建模。
邏輯模擬。
故障建模。
故障模擬。
單點故障測試。
連接故障測試。
功能測試。
可測性設計。
壓縮技術。
內建自測。
邏輯級診斷。
自檢設計。
PLA測試。
系統級診斷。
索引。