Integrated Circuit Test Engineering: Modern Techniques (Paperback)

Ian A. Grout

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Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits.

Taking a three-pronged approach – dealing with test engineering from traditional-test, design and manufacturing view-points – Integrated Circuit Test Engineering encapsulates the subject as it stands today. After an introduction covering background from basic testing rules to trends in technology, the reader learns about:

• fabrication processes;

• a diverse and complete range of detailed tests and procedures calculated to teach you all the tests you will require and how to choose which one(s) to use;

• how to design for testability;

• fault simulation;

• automatic test equipment and

• the economics of testing.

From a practical perspective, the text includes:

• A range of worked examples and exercises together with well-organized references and bibliography to aid further enquiry.

• An introduction to various software such as MATLAB® and Spice explaining their use in testing together with that of IEEE-standard hardware-description languages Verilog®-HDL and VHDL.

• A series of experiments based on material which can be freely downloaded from springeronline.com instructing you in the construction of a hardware test arrangement for MS Windows PCs (functionality, schematic and printed-circuit-board layout)with Visual Basic programs to drive the experiments.

Integrated Circuit Test Engineering provides a thorough-going and illuminating introduction to test engineering in analogue, digital and mixed-signal integrated circuits. This text is a valuable practical learning tool for advanced undergraduate and graduate electronic engineering students, an excellent teaching resource for their tutors and a useful guide for the practising electronic engineer.

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描述

近60年前,第一次成功展示的晶體管證明了微電子新時代的開端。現在,微電子電路的複雜性和功能速度不斷增加,現在包含數千萬個晶體管,需要在開發和生產過程中進行適當和嚴格的測試工程活動。測試工程也必須與微電子設計更緊密地結合。對電路測試工程的理解對於任何希望從事集成電路設計或製造的學生來說都是至關重要的。

《集成電路測試工程》以傳統測試、設計和製造的觀點來處理測試工程,將主題完整地呈現出來。在介紹中,從基本測試規則到技術趨勢的背景,讀者將學習以下內容:

• 製造過程;
• 各種詳細的測試和程序,旨在教授您所需的所有測試以及如何選擇使用哪些測試;
• 如何設計可測試性;
• 故障模擬;
• 自動測試設備;
• 測試的經濟性。

從實際角度出發,本書包括:

• 一系列的實例和練習,以及組織良好的參考文獻和文獻目錄,以便進一步查詢;
• 介紹各種軟件,如MATLAB和Spice,解釋它們在測試中的使用,以及IEEE標準硬件描述語言Verilog-HDL和VHDL的使用;
• 一系列基於可從springeronline.com免費下載的材料的實驗,指導您在MS Windows PC上構建硬件測試配置(功能、原理圖和印刷電路板布局),並使用Visual Basic程序來驅動實驗。

《集成電路測試工程》全面而深入地介紹了模擬、數字和混合信號集成電路的測試工程。本書是高級本科和研究生電子工程學生的寶貴實踐學習工具,也是他們的導師的優秀教學資源,對於實踐的電子工程師也是一個有用的指南。