Symbolic Analysis Techniques: Applications To Analog Design Automation


  • 出版商: Wiley
  • 出版日期: 1998-01-06
  • 售價: $5,970
  • 貴賓價: 9.5$5,672
  • 語言: 英文
  • 頁數: 410
  • 裝訂: Hardcover
  • ISBN: 0780310756
  • ISBN-13: 9780780310759
  • 海外代購書籍(需單獨結帳)



Electrical Engineering Symbolic Analysis Techniques Applications to Analog Design Automation Symbolic Analysis Techniques is a collection of original contributions from renowned experts in the field presenting the most recent and important applications of symbolic analysis to analog circuit design. This timely, self-contained volume features an in-depth tutorial introduction to the techniques and algorithms underlying modern symbolic analyzers, and includes many references at the end of each chapter. Applications are discussed in a variety of important fields:

  • Automatic generation of optimum circuit topologies
  • Interactive circuit improvement and automated design space exploration
  • Non-fixed topology analog synthesis tools
  • Semiconductor parameter extraction
  • Analog testability and fault diagnosis
  • And many more related areas!

Symbolic Analysis Techniques also features an extensive comparison of modern symbolic analyzer characteristics and limitations. Brimming with practical instructions on tasks like formula simplification and post-processing, this book will be of use and interest to graduate students, researchers, and engineers involved in computer-aided circuits analysis and analog design automation.


Table of Contents:




Symbolic Analysis Techniques: A Review.

Symbolic Analysis of Sampled-Data Systems.

Symbolic Analysis of Switched Analog Circuits.

Hierarchical Symbolic Analysis of Large Analog Circuits.

Symbolic Formula Approximation.

Symbolic Analysis of Weakly Nonlinear Analog Integrated Circuits.

Structural Synthesis and Optimization of Analog Circuits.

Automated Analog Design Using Compiled Symbolic Models.

Symbolic Signal Flow Graph Methods in Switched-Capacitor Design.

Symbolic Methods in Semiconductor Parameter Extraction.

Statistical Delay Characterization of CMOS Digital Combinational Circuits.

Analog Testability and Fault Diagnosis Using Symbolic Analysis.


About the Editors.