Reliability Prediction for Microelectronics

RELIABILITY PREDICTION FOR MICROELECTRONICS

Wiley Series in Quality & Reliability Engineering

REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK

Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability.

Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing.

Reliability Prediction for Microelectronics readers will also find:

• Focus on the tools required to perform reliability assessments in real operating conditions
• Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more
• New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI

Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.

微電子可靠性預測
Wiley品質與可靠性工程系列
這本開創性的書籍將改變您對可靠性評估的方法
可靠性評估是工程中至關重要的一個方面，如果沒有進行評估，機器在預期參數範圍內的安全性能無法得到保證。尤其是在微電子領域，評估可靠性的挑戰是相當大的，而創建微電子可靠性標準的統計方法也很複雜。隨著納米級微電子設備在現代生活中越來越重要，了解評估可靠性的工具變得更加重要。

《微電子可靠性預測》以可靠性物理學原理和剩餘使用壽命（RUL）的概念為核心，提供了一系列工具，滿足了這方面的需求。它將“故障物理學”作為其核心主題，結合對傳統可靠性評估方法的深入理解以及對其盲點的敏銳認識。它使工程師和研究人員能夠克服數十年來錯誤的可靠性物理學，將他們的工作放在堅實的工程基礎上。

《微電子可靠性預測》的讀者還將找到：
- 專注於在實際操作條件下進行可靠性評估所需的工具
- 詳細討論故障基礎、可靠性測試、加速因子計算等主題
- 新的多物理故障模型，包括TDDB、EM、HCI和BTI在DSM技術上的應用

《微電子可靠性預測》非常適合可靠性和品質工程師、設計工程師以及希望了解產品設計和測試這一關鍵領域的高級工程學生。

JOSEPH B. BERNSTEIN, PHD, is Director of the Laboratory for Failure Analysis and Reliability of Electronic Systems at Ariel University, Israel. He has worked and published extensively on failure analysis and defect avoidance in microelectronics, and is a senior member of IEEE.

ALAIN A. BENSOUSSAN, PHD, is a Consulting Reliability Engineer with decades of experience as an Expert on Optics and Opto-Electronics Parts at Thales Alenia Space. He has conducted research in many areas of microelectronics reliability and physics of failure.

EMMANUEL BENDER, PHD, completed his PhD in Electrical and Electronics Engineering, specializing in Microelectronics Reliability, at Ariel University, Israel, in 2022.

JOSEPH B. BERNSTEIN, PHD, 是以色列亞利爾大學電子系統失效分析和可靠性實驗室的主任。他在微電子失效分析和缺陷避免方面有豐富的工作和出版物，並且是IEEE的高級會員。

ALAIN A. BENSOUSSAN, PHD, 是Thales Alenia Space的光學和光電子零件專家，擁有數十年的咨詢可靠性工程師經驗。他在微電子可靠性和失效物理等多個領域進行了研究。

EMMANUEL BENDER, PHD, 於2022年在以色列亞利爾大學完成了他的電氣與電子工程博士學位，專攻微電子可靠性。