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商品描述
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
商品描述(中文翻譯)
《CMOS 測試與評估：物理觀點》是一本綜合性資料，提供對 CMOS 產品測試和數據分析方法的整體視角，涵蓋電路對 MOSFET 特性的敏感度、矽技術製程變異的影響、嵌入式測試結構和感測器的應用、產品良率以及產品在其壽命期間的可靠性。本書還涵蓋統計數據分析和可視化技術、測試設備和 CMOS 產品規格，並檢視產品在其全電壓、溫度和頻率範圍內的行為。
