Hot Carrier Degradation in Semiconductor Devices (Hardcover)

Tibor Grasser

  • 出版商: Springer
  • 出版日期: 2014-12-01
  • 售價: $5,640
  • 貴賓價: 9.5$5,358
  • 語言: 英文
  • 頁數: 517
  • 裝訂: Hardcover
  • ISBN: 3319089935
  • ISBN-13: 9783319089935
  • 相關分類: 半導體

下單後立即進貨 (約1週~2週)

買這商品的人也買了...

商品描述

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices.  Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.